기술 지원: 테스트 및 측정

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro Originally broadcast Jan 27, 2011 웹캐스트 - recorded
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) Original broadcast Feb 2, 2012 웹캐스트 - recorded
New Power Device Measurement Solutions (1500 A / 10 kV) Original broadcast June 19, 2012 웹캐스트 - recorded
Parametric Test Basic Training Part 2 Originally broadcast Jan 19, 2011 웹캐스트 - recorded
Semiconductor Parametric Test: Back to Basics Part 2 The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations. 웹캐스트 - recorded
Setting Up IC-CAP WaferPro For On-Wafer Measurements originally broadcast June 22, 2011 웹캐스트 - recorded
Small signal, low level, DC Parametric measurements: Back to Basics Part 1 The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements. 웹캐스트 - recorded
SPECS User Training Learn to quickly develop and run SPECS test plans to obtain semiconductor parametric information. 교육

기술 지원