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Choose the right system calibration services for your Agilent i3070/3070 In-circuit Test System
Agilent offer a range of new calibration service with and without system calibration license to use for your Agilent i3070/3070 In-circuit Test System

Case Study 2012-09-28

In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Agilent N5747A high-power power supply on a customer product - a networking board project.

Case Study 2011-02-11

PDF PDF 1.12 MB
Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

PDF PDF 175 KB
Flash Programming - Agilent Utility Card versus Deep Serial Memory Case Study
This case study compares flash programming performances of the Agilent Medalist i3070 Series 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne ICT solution.

Case Study 2010-07-07

PDF PDF 155 KB
Flash programming with the Agilent Utility Card - Successful Implementation
This case study details the successful implementation of flash programming with the Agilent utility card in the manufacturing environment.

Case Study 2010-06-28

PDF PDF 144 KB
Overcoming Limited Access with Cover-Extend Technology at In-Circuit Test
This case study illustrates how Agilent's Cover-Extend Technology can help to enable test access for situations where test access becomes increasingly limited with usage of high complexity components on computer motherboards.

Case Study 2009-07-22

PDF PDF 149 KB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Agilent Medalist Family of test and inspection systems.

Case Study 2005-03-14

WMF WMF 19.21 MB
Pins Test Detects Bondwire Failures
Recently, a high volume 3070 user came across a batch of devices with bad bondwires from the chip vendor. The symptom at ICT was failing "pins" tests (sometimes known as "Chek-Point").

Case Study 2004-05-26

PDF PDF 53 KB
Vectorless Test EP (VTEP) Goes Head-to-Head with Agilent TestJet
In beta tests, VTEP proved its abilities to improve in-circuit test coverage by over 80 percent compared to Agilent TestJet, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

Case Study 2003-12-16

PDF PDF 351 KB
Selcom Group Uses Integrated Test to Cut Costs and Increase Business
Selcom Group uses a combination of test technologies from Agilent to meet stringent cost, quality, and shipping targets, allowing Selcom to continue growing and thriving in a difficult worldwide economy.

Case Study 2003-10-24

PDF PDF 600 KB
Agilent Quality Tool Testimonials
Learn what users have to say about Agilent Quality Tool.

Case Study 2003-09-30

ScanWorks Reduces Vivace Networks' ICT Costs and Improves Board Quality
This paper discusses how Vivace Networks uses ScanWorks at the benchtop and at in-circuit test to reduce test costs and accelerate time to market in a competitive environment.

Case Study 2003-07-31

PDF PDF 29 KB
Lucent Demonstrates how ScanWorks for the Agilent 3070 Can Save Nearly $1 Million Per Year
Lucent has demonstrated that reusing ScanWorks boundary-scan tests on the 3070 ICT platform can produce dramatic cost savings through lower test development and fixture costs without giving up test coverage.

Case Study 2003-07-23

PDF PDF 222 KB
Motorola Drives Reliability and Productivity of In-Car Safety Systems with the Agilent 3070
To maintain rigorous testing without hindering assembly line productivity, Motorola chose the Agilent 3070 In-circuit Test System.

Case Study 2003-06-03

PDF PDF 2.01 MB
ScanWorks Completes Successful Assessment at Jabil Circuit
One of the first places electronics manufacturers look to reduce expenses is through the elimination of redundant effort.

Case Study 2003-03-21

PDF PDF 661 KB
AwareTest xi Case Study #3
This case study compares fault coverage of the current test strategy (automatic optical inspection/full in-circuit test) with a combined x-ray inspection/simplified in-circuit test strategy.

Case Study 2003-02-15

PDF PDF 164 KB
AwareTest xi Case Study #1
This case study compares a fully-probed in-circuit test on a conventional high node count test system with a combined x-ray/in-circuit test strategy, using the simplified in-circuit test.

Case Study 2003-02-15

PDF PDF 127 KB
AwareTest xi Case Study #2
This case study compares the current test strategy with a full combined test strategy and a simplified combined test strategy (x-ray inspection followed by simplified in-circuit test).

Case Study 2003-02-15

PDF PDF 763 KB
Advanced Energy Industries, Inc. Adopts 3070 In-Circuit Test with MS Windows OS
The stakes were high, but the upside benefits of PC-based test were hard to ignore. Here's how one company made the move.

Case Study 2002-07-17

PDF PDF 363 KB
Notebook Manufacturer Finds Margins in the Details
Design-for-manufacturing methods and an automated test environment help FIC control costs, improve product quality, and protect its margins.

Case Study 2002-02-07

PDF PDF 457 KB
Streamlining Test For A Competitive Marketplace
The market price for telephones has dropped ten per-cent each year over the last ten years. To stay competitive, Landis & Gyr Communications, a manufacturer of public telephones, must produce reliable phones faster, with more features for less money.

Case Study 2000-04-01

PDF PDF 98 KB
In-Circuit Testing of High Node Count Boards--Bigger is Not Always Better
The in-circuit test (ICT) engineer faces serious financial and technical challenge when testing more than 3500 nodes.

Case Study 2000-02-01

PDF PDF 77 KB