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Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 402 KB
Smart Meter Test Solutions - Product Overview
As smart grid adoption increases, manufacturers of smart meters will need to adopt new and better test strategies and technologies to meet board and functional test requirements and stay competitive.

Technical Overview 2010-11-29

PDF PDF 802 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Agilent Test Coverage Consultant up and running on your PC quickly.

Technical Overview 2010-11-17

PDF PDF 242 KB
System Spares Onsite Agreement
This is the data sheet on system spares onsite agreement for uptime support

Data Sheet 2010-11-15

PDF PDF 201 KB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Agilent Medalist i1000D platform to use state-of-the-art in-circuit test technology.

Application Note 2010-10-22

PDF PDF 3.27 MB
The Proposed IEEE Test Standards
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 2.83 MB
A New Equilibrium
The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

Article 2010-10-20

PDF PDF 192 KB
Limited Access Tools Improve Test Coverage
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 275 KB
Access Secured Information on our Agilent.com Customer Website
In this issue, we would like to start by providing information for you to access the reserved resources we have on the Agilent Customer website, which is accessible only to our support agreement customers.

Newsletter 2010-09-19

White paper: High Performance Flash Programming on the Medalist i3070 Series 5
Download the White Paper : High Performance Flash Programming on the Medalist i3070 Series 5

Promotional Materials 2010-08-30

From software to RF
Test Engineer of the Year: Lisa Moder ensures the quality of EchoStar’s set-top boxes at manufacturing facilities around the world.

Article 2010-08-30

Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

PDF PDF 175 KB
Agilent System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Agilent's range of support products for in-circuit test, imaging inspection and functional test systems.

Data Sheet 2010-08-06

PDF PDF 238 KB
Agilent Medalist i3070 08.10p Software Release
This software release includes many enhancements and improvements to software stability such as DC test methodology for large capacitors and Cover-Extend testing on integrated circuits

Release Notes 2010-08-02

Agilent Support Agreement - Consumables Exclusion List for Alternative Functional Test
This data sheet provides a list of consumable parts not covered under the Agilent Support Agreements for In-Circuit Test, Functional Test, Automated X-Ray and Optical Inspection solutions.

Data Sheet 2010-07-16

PDF PDF 85 KB
Flash Programming - Agilent Utility Card versus Deep Serial Memory Case Study
This case study compares flash programming performances of the Agilent Medalist i3070 Series 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne ICT solution.

Case Study 2010-07-07

PDF PDF 155 KB
Flash programming with the Agilent Utility Card - Successful Implementation
This case study details the successful implementation of flash programming with the Agilent utility card in the manufacturing environment.

Case Study 2010-06-28

PDF PDF 144 KB
Medalist i1000 In-Circuit Test System
Medalist i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution for original design manufacturers who need “just-enough tests”.

Data Sheet 2010-06-21

PDF PDF 551 KB
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Comparing Boundary Scan Methods White Paper
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

Article 2010-06-09

PDF PDF 2.68 MB
UCM3070 Boundary Scan Module for the Agilent Utility Card
This document describes the features of the UCM3070 boundary scan controller which is integrated into the Medalist i3070 in-circuit test system. It is based on Goepel Scanbooster architecture.

Technical Overview 2010-06-08

PDF PDF 209 KB
Access Entitled Content on our Agilent.com Customer Website
Customers who have active warranty or support agreement for their ICT, AXI or AOI test system can register for access to Printed Circuit Assembly Board Test and Inspection entitled content.

Newsletter 2010-05-31

Rehost Service for Agilent ICT, AXI and AOI systems
Rehost service is included as part of Agilent support agreement for hardware support or software subscription service.

Feature Story 2010-05-25

Medalist VTEP v2.0 Powered, with Cover-Extend technology
This brochure provides an overview of Cover-Extend under the VTEP v2.0 Powered vectorless test suite

Brochure 2010-04-06

PDF PDF 237 KB
Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Agilent Medalist i3070 in-circuit test solution.

Application Note 2010-04-01

PDF PDF 207 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Agilent Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2010-03-15

PDF PDF 1.08 MB

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