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Test & Measurement

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A Primer on Test Options - Article Reprint
This paper discusses why ICT remains the best option for high-volume electronics manufacturing, with its flexibility to provide a myriad of test options to meet different manufacturing needs.

Article 2011-08-08

PDF PDF 269 KB
Medalist i1000D Boundary Scan Debug
This white paper discusses how to effectively debug boundary scan tests on the Medalist i1000D in-circuit tester.

Application Note 2011-08-01

PDF PDF 896 KB
Silicon Nails increases your test coverage

Demo 2011-07-22

Test Coverage Consultant - Data Sheet
The Agilent Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Agilent Test Coverage Consultant Agilent Medalist i3070 Series 5

Data Sheet 2011-07-14

PDF PDF 214 KB
How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Agilent N5747A high-power power supply on the Agilent Medalist i3070 Series 5 in-circuit tester.

Application Note 2011-04-04

PDF PDF 2.39 MB
In-circuit test – Still standing strong
Nay-sayers who about a decade ago started doubting the viability of in-circuit test should look at the thriving sub-ecosystem that is supporting this manufacturing test stalwart.

Article 2011-03-11

PDF PDF 294 KB
In-Circuit Tester - N5747A High-Power Power Supply - Case Study
This paper discusses the first successful implementation of the Agilent N5747A high-power power supply on a customer product - a networking board project.

Case Study 2011-02-11

PDF PDF 1.12 MB
Agilent Medalist i3070 08.20p Software Release
The Agilent Medalist i3070 Software 08.20p release enables High Voltage Zener testing up to 60V with the ASRU Revision N card.

Release Notes 2011-02-08

Programming In-System versus Offline-Article Reprint
Is offline programming or ISP at in-circuit test better? One key consideration is the cost of each method. This paper looks at pros and cons of these two methods contributing to the overall costing.

Article 2011-01-13

PDF PDF 159 KB
Latin America: Pushing the Boundaries of Test-Article Reprint
A first-hand stock taking of the EMS scene in Brazil and Mexico from an engineer's road trip.

Article 2011-01-13

PDF PDF 966 KB
TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

Article 2010-12-10

PDF PDF 789 KB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 1.10 MB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 402 KB
Smart Meter Test Solutions - Product Overview
As smart grid adoption increases, manufacturers of smart meters will need to adopt new and better test strategies and technologies to meet board and functional test requirements and stay competitive.

Technical Overview 2010-11-29

PDF PDF 802 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Agilent Test Coverage Consultant up and running on your PC quickly.

Technical Overview 2010-11-17

PDF PDF 242 KB
System Spares Onsite Agreement
This is the data sheet on system spares onsite agreement for uptime support

Data Sheet 2010-11-15

PDF PDF 201 KB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Agilent Medalist i1000D platform to use state-of-the-art in-circuit test technology.

Application Note 2010-10-22

PDF PDF 3.27 MB
Limited Access Tools Improve Test Coverage
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 275 KB
The Proposed IEEE Test Standards
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 2.83 MB
A New Equilibrium
The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

Article 2010-10-20

PDF PDF 192 KB
Access Secured Information on our Agilent.com Customer Website
In this issue, we would like to start by providing information for you to access the reserved resources we have on the Agilent Customer website, which is accessible only to our support agreement customers.

Newsletter 2010-09-19

Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

PDF PDF 175 KB
Agilent System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Agilent's range of support products for in-circuit test, imaging inspection and functional test systems.

Data Sheet 2010-08-06

PDF PDF 238 KB

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