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i3070 In-Circuit Test System Onsite Agreement - Flyer
Agilent's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer's needs, together with the latest hardware and software.

ブローシャ 2013-03-26

PDF PDF 246 KB
Medalist i1000D Small Foot Print In-Circuit Test - Technical Overview
The Agilent Medalist i1000D is now fully automated with in-line capabilities. It is the smallest foot print in-circuit tester for PCBA lines.

技術概要 2013-03-01

PDF PDF 274 KB
言語 
x1149 Boundary Scan Analyzer - Data Sheet
The Agilent x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

データシート 2013-02-14

PDF PDF 898 KB
言語 
Limited Parts Agreement
Agilent understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

ブローシャ 2013-01-04

PDF PDF 126 KB
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Agilent!
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Agilent!

プロモーション資料 2012-11-07

ICT System Support Delivery Options
Support delivery guidelines for Agilent In-circuit Test Systems.

技術概要 2012-10-16

PDF PDF 41 KB
Reducing Cost of Testing Prototypes with the Agilent Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Agilent Medalist i1000D as a viable option which can help save time and money.

アプリケーション・ノート 2012-10-05

PDF PDF 324 KB
Choose the right system calibration services for your Agilent i3070/3070 In-circuit Test System
Agilent offer a range of new calibration service with and without system calibration license to use for your Agilent i3070/3070 In-circuit Test System

事例紹介 2012-09-28

Medalist i3070 Series 5 In-Circuit Test System
The Agilent Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.

データシート 2012-09-25

PDF PDF 450 KB
言語 
Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

アプリケーション・ノート 2012-09-19

PDF PDF 7.41 MB
i3070 High Node Count Test Solution - Technical Overview
Agilent's high node count test solution allows any Agilent 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術概要 2012-09-07

PDF PDF 261 KB
ICT Total Cost of Ownership - Article Reprint
This article examines how the total cost of ICT ownership continues to change. It discusses the factors that a manufacturer should consider before making an investment.

記事 2012-08-24

PDF PDF 294 KB
Expanding Coverage with Boundary Scan - Article Reprint
Limited access tests can expand or leverage on boundary scan and provide more test coverage for a myriad of devices, beyond just boundary scan device coverage.

記事 2012-08-24

PDF PDF 206 KB
The Value of the in-Circuit Tester - Article Reprint
This article discusses how in-circuit testers for PCBAs can play a significant role to enhance product value and increase production efficiency for electronics manufacturers.

記事 2012-08-24

PDF PDF 1.04 MB
Changes in Test Coverage - Article Reprint
This article discusses challenges behind in-circuit testing on modern-day high speed, high complexity PCBAs, and work-around solutions currently available.

記事 2012-08-24

PDF PDF 235 KB
Refresh your Agilent 3070 In-Circuit Test System with Agilent’s 3-in-1PC Upgrade
The Agilent 3-in-1 PC Upgrade Support Agreement enables customers to replace their legacyAgilent3070 In-Circuit Test Systemtest head controller with the latest PC controller and gain access to the latest Agilent ICT features and capabilities.

ブローシャ 2012-07-25

PDF PDF 242 KB
Agilent Medalist i3070 08.30p Software Release
The Medalist i3070 08.30p software release enables the BT-Basic external DLL integration and an industry first Medalist i3070 LED Test to inspect color and intensity of LEDs in the visible light spectrum range.

リリース・ノート 2012-07-24

Medalist i3070 LED Test - Technical Overview
The Agilent Medalist i3070 light emitting diode test suite delivers excellent repeatability and accuracy in LED color and luminosity measurements and superior throughput during i3070 in-circuit test.

技術概要 2012-05-16

PDF PDF 345 KB
Testing DDR Memory; How On-Chip DFT Helps
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

記事 2012-04-17

PDF PDF 530 KB
Boundary-Scan Advanced Diagnostic Methods
This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.

記事 2012-04-17

PDF PDF 1.20 MB
Agilent i1000D診断テスト・セット

技術概要 2012-04-16

PDF PDF 1.41 MB
言語 
Learn more about Medalist In-Circuit and Manufacturing Functional Test Platforms
Request literature on ICT and MFT, In-Circuit Test and Manufacturing Functional Test Platforms

ブローシャ 2012-03-13

One Stop Shop In-Circuit Test Support Services - Brochure
Agilent's seamless support helps keep your in-circuit testers running smoothly, so you can focus on delivering quality to your customers,quickly.

ブローシャ 2012-02-16

PDF PDF 694 KB
Agilent Medalist i3070 08.21p Software Release
The intent of the Agilent Medalist i3070 08.21p software release is to extend support to the Windows® 7 (32-bit) operating system. This software release is based on the Medalist i3070 08.20pb software release. There are no enhancements or change request fixes in this release.

リリース・ノート 2012-01-30

3070/i3070 DUT Power Supply Document Library
This document library contains the installation manual, programming guide and operating guide/manual of the various models of DUT power supply that are supported on the Agilent 3070/i3070 ICT systems.

ユーザ・マニュアル 2012-01-25

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