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Smart Meter Test Solutions - Product Overview
As smart grid adoption increases, manufacturers of smart meters will need to adopt new and better test strategies and technologies to meet board and functional test requirements and stay competitive.

技術概要 2010-11-29

PDF PDF 802 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Agilent Test Coverage Consultant up and running on your PC quickly.

技術概要 2010-11-17

PDF PDF 242 KB
System Spares Onsite Agreement
This is the data sheet on system spares onsite agreement for uptime support

データシート 2010-11-15

PDF PDF 201 KB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Agilent Medalist i1000D platform to use state-of-the-art in-circuit test technology.

アプリケーション・ノート 2010-10-22

PDF PDF 3.27 MB
The Proposed IEEE Test Standards
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

記事 2010-10-20

PDF PDF 2.83 MB
A New Equilibrium
The EMS and ODM markets are moving to a new equilibrium as they continue to balance cost pressures and technology evolution. This article looks at the trends shaping this new balance.

記事 2010-10-20

PDF PDF 192 KB
Limited Access Tools Improve Test Coverage
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

記事 2010-10-20

PDF PDF 275 KB
Access Secured Information on our Agilent.com Customer Website
In this issue, we would like to start by providing information for you to access the reserved resources we have on the Agilent Customer website, which is accessible only to our support agreement customers.

ニュースレター 2010-09-19

White paper: High Performance Flash Programming on the Medalist i3070 Series 5
Download the White Paper : High Performance Flash Programming on the Medalist i3070 Series 5

プロモーション資料 2010-08-30

From software to RF
Test Engineer of the Year: Lisa Moder ensures the quality of EchoStar’s set-top boxes at manufacturing facilities around the world.

記事 2010-08-30

Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

事例紹介 2010-08-11

PDF PDF 175 KB
Agilent System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Agilent's range of support products for in-circuit test, imaging inspection and functional test systems.

データシート 2010-08-06

PDF PDF 238 KB
Agilent Medalist i3070 08.10p Software Release
This software release includes many enhancements and improvements to software stability such as DC test methodology for large capacitors and Cover-Extend testing on integrated circuits

リリース・ノート 2010-08-02

Agilent Support Agreement - Consumables Exclusion List for Alternative Functional Test
This data sheet provides a list of consumable parts not covered under the Agilent Support Agreements for In-Circuit Test, Functional Test, Automated X-Ray and Optical Inspection solutions.

データシート 2010-07-16

PDF PDF 85 KB
Flash Programming - Agilent Utility Card versus Deep Serial Memory Case Study
This case study compares flash programming performances of the Agilent Medalist i3070 Series 5 in-circuit tester (ICT) with utility card flash programming solution against the Teradyne ICT solution.

事例紹介 2010-07-07

PDF PDF 155 KB
Flash programming with the Agilent Utility Card - Successful Implementation
This case study details the successful implementation of flash programming with the Agilent utility card in the manufacturing environment.

事例紹介 2010-06-28

PDF PDF 144 KB
Comparing Boundary Scan Methods White Paper
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

記事 2010-06-09

PDF PDF 2.68 MB
UCM3070 Boundary Scan Module for the Agilent Utility Card
This document describes the features of the UCM3070 boundary scan controller which is integrated into the Medalist i3070 in-circuit test system. It is based on Goepel Scanbooster architecture.

技術概要 2010-06-08

PDF PDF 209 KB
Access Entitled Content on our Agilent.com Customer Website
Customers who have active warranty or support agreement for their ICT, AXI or AOI test system can register for access to Printed Circuit Assembly Board Test and Inspection entitled content.

ニュースレター 2010-05-31

PCBAテストの受賞歴

特集記事 2010-05-06

バウンダリ・スキャン/JTAG
電子製造テストの分野では、バウンダリ・スキャン・テクノロジーはIC間の相互接続をテストするための技術として一般的になっています。

特集記事 2010-05-06

Medalist VTEP v2.0 Powered, with Cover-Extend technology
This brochure provides an overview of Cover-Extend under the VTEP v2.0 Powered vectorless test suite

ブローシャ 2010-04-06

PDF PDF 237 KB
Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Agilent Medalist i3070 in-circuit test solution.

アプリケーション・ノート 2010-04-01

PDF PDF 207 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Agilent Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

アプリケーション・ノート 2010-03-15

PDF PDF 1.08 MB
Protecting the Integrated Circuit from Over Powering
This application describes how the power monitoring circuit on the Medalist i3070 Serie 5 in-circuit tester provides real-time monitoring to prevent damage to the ICs on the circuit boards.

アプリケーション・ノート 2010-03-09

PDF PDF 111 KB
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