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In-circuit Test Systems - 3070 ICT

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Reducing Cost of Testing Prototypes with the Agilent Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Agilent Medalist i1000D as a viable option which can help save time and money.

Application Note 2012-10-05

PDF PDF 324 KB
Are you getting everything from In-Circuit Test? White Paper
This white paper presents two case studies on how customers are successfully combining additional test features with ICT using Agilent i3070 Series 5 technology to maximize their ICT capabilities.

Application Note 2012-09-19

PDF PDF 7.41 MB
Medalist i1000D with Board Handler - Application Note
The i1000D with JET board handlers enables low-cost ICT in a fully automated environment, with reduced labor cost while enabling higher test coverage for components on today's complex PCBAs.

Application Note 2011-10-03

PDF PDF 224 KB
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Medalist i1000D Boundary Scan Debug
This white paper discusses how to effectively debug boundary scan tests on the Medalist i1000D in-circuit tester.

Application Note 2011-08-01

PDF PDF 896 KB
How to build a fixture for use with the Agilent Cover-Extend Technology
Cover-Extend Technology is Agilent’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2011-06-23

PDF PDF 150 KB
Using N5747A High-Power Power Supply with the Medalist i3070 Series 5 - Application Note
This paper documents the information needed to develop and turn on a test program utilizing the new Agilent N5747A high-power power supply on the Agilent Medalist i3070 Series 5 in-circuit tester.

Application Note 2011-04-04

PDF PDF 2.39 MB
TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

PDF PDF 2.17 MB
Make the Move From MTS 160 To Medalist i1000D In-Circuit Test Application Note
This application note describes how to convert the hardware and software from the MTS160 MDA platform to the Agilent Medalist i1000D platform to use state-of-the-art in-circuit test technology.

Application Note 2010-10-22

PDF PDF 3.27 MB
Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Agilent Medalist i3070 in-circuit test solution.

Application Note 2010-04-01

PDF PDF 207 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Agilent Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2010-03-15

PDF PDF 1.08 MB
Protecting the Integrated Circuit from Over Powering
This application describes how the power monitoring circuit on the Medalist i3070 Serie 5 in-circuit tester provides real-time monitoring to prevent damage to the ICs on the circuit boards.

Application Note 2010-03-09

PDF PDF 111 KB
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Testing Bridges to Nowhere-Combining Boundary Scan and Capacitive Sensing
This paper describes existing limitations of the 1149.1 boundary scan techniques, IC design changes that would address these limitations and some experimental results. Reprinted with permission from IEEE.

Application Note 2010-01-06

PDF PDF 455 KB
An Outlier Detection Based Approach for PCB Testing
This paper discusses enhancements to the capacitative leadframe testing technique, more commonly known as the Agilent patented VTEP technology. Reprinted with permission from IEEE.

Application Note 2010-01-06

PDF PDF 1004 KB
Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series
Agilent's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2009-12-02

PDF PDF 332 KB
Vectorless Test Solutions --An analysis of performance differences between VTEP
This white paper provides an analysis of performance differences between Agilent VTEP, FrameScan FX and TestJet Enhanced technologies.

Application Note 2009-11-03

PDF PDF 214 KB
Network Parameter Measurement: Best Practices using the Agilent Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Agilent Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Agilent Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

PDF PDF 342 KB
Enhanced Log Records for the Agilent Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
Medalist i3070 Test Throughput Optimization
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2008-11-24

PDF PDF 163 KB
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IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 ICT Systems
This paper introduces the latest advancements in Boundary Scan test capabilities on the Agilent Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Application Note 2008-11-24

PDF PDF 297 KB
Incorporating TCM Customizations into the Operator Interface of the Medalist i3070 ICT
users can use the old TCM operator interface, or the new i3070 Operator GUI and keep the operator interface customizations they are used to.

Application Note 2008-11-01

Comparing Contact Performance on PCBA using Conventional Testpads and Bead Probe
This white paper captures the details of an evaluation performed on the notebook motherboard of a leading Original Equipment Manufacturer using Agilent Medalist Bead Probes Technology.

Application Note 2008-10-31

PDF PDF 428 KB
First pass Yield (FPY) and Alarm Triggers on the Agilent Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.

Application Note 2008-09-26

PDF PDF 131 KB
Slashing Debugging time with the Agilent Medalist i3070 In-Circuit Test AutoDebug Tool
This app note provides an overview of the AutoDebug tool on the Agilent Medalist i3070 In-Circuit Test Software version 07.00.

Application Note 2008-09-01

PDF PDF 324 KB
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