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In-circuit Test Systems - 3070 ICT

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Offline vs Inline: Shifting to automated inline ICT - White Paper
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

Application Note 2014-05-14

Medalist i3070 Series 5i inline ICT system help
Agilent's Medalist i3070 Series 5i Inline In- Circuit Test (ICT) system is designed to bring all the industry- leading ICT technologies into a fully automated manufacturing line.

Help File 2014-05-02

PDF PDF 19.86 MB
Medalist i3070 Series 5i inline ICT system uncrating instructions
Medalist i3070 Series 5i inline ICT system uncrating procedure

Quick Start Guide 2014-05-02

PDF PDF 742 KB
Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Application Note 2014-03-26

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Agilent Medalist i3070 08.40p Software Release
Agilent Medalist i3070 08.40p software can be installed on testheads and test development stations with Windows 7 (32- bit and 64- bit) and Windows XP operating systems.

Release Notes 2014-02-17

Return-to-Agilent Agreement for i3070 In-Circuit Test Systems - Brochure
Return to Agilent is a repair service agreement for your Agilent i3070 and 3070 in-circuit test systems to ensure your system uptime is maximized.

Brochure 2014-01-15

PDF PDF 2.93 MB
Medalist i3070 Series 5i Inline ICT System Operator Guide
Medalist i3070 Series 5i Inline ICT System Operator Guide

Operation Manual 2013-12-20

PDF PDF 449 KB
Medalist i3070 Series 5i Inline System Installation Guide
Medalist i3070 Series 5i Inline ICT System System Installation

Installation Manual 2013-12-20

PDF PDF 4.69 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Agilent x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Agilent x1149 Boundary Scan Analyzer.

Application Note 2013-11-07

PDF PDF 382 KB
Releasing the “Test Sequence” and “Test” to Production on the Agilent x1149 Boundary Scan Analyzer
This application note describes how to release test sequences and tests to production when using the Agilent x1149 Boundary Scan Analyzer.

Application Note 2013-10-18

PDF PDF 523 KB
Agilent PCBA Test Award-winning Milestones

Feature Story 2013-10-09

The World’s Highest Pin Count In-Circuit Test Solutions – Solution Sources Programming
The World’s Highest Pin Count In-Circuit Test Solutions from Solution Sources and Agilent

Brève de solutions 2013-09-18

The World’s Highest Pin Count In-Circuit Test Solutions - Brochure
Agilent's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2013-09-18

PDF PDF 129 KB
Medalist i3070 and 3070 In-circuit Test Fixture Accessories - Catalog
View the catalog for Agilent i3070 and 3070 in-circuit test (ICT) fixture accessories.

Catalog 2013-09-12

PDF PDF 569 KB
Medalist i3070 Series 5i Inline In-Circuit Test System – Data Sheet
Agilent’s Medalist i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

Data Sheet 2013-09-03

Medalist i1000D Small Foot Print In-Circuit Test - Technical Overview
The Agilent Medalist i1000D is now fully automated with in-line capabilities. It is the smallest foot print in-circuit tester for PCBA lines.

Technical Overview 2013-08-23

Configuring Boundary Scan Chains on Agilent x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Agilent x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Merging boards on Agilent x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Agilent x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
x1149 Boundary Scan Analyzer - Technical Overview
The Agilent x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

Technical Overview 2013-07-22

PDF PDF 1.24 MB
i3070 In-Circuit Test System Onsite Agreement - Flyer
Agilent's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer's needs, together with the latest hardware and software.

Brochure 2013-03-26

PDF PDF 246 KB
x1149 Boundary Scan Analyzer - Data Sheet
The Agilent x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

Data Sheet 2013-02-14

Limited Parts Agreement
Agilent understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

Brochure 2013-01-04

PDF PDF 126 KB
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Agilent!
Looking to sell or buy used or pre-owned 3070 in circuit testers? Talk to Agilent!

Promotional Materials 2012-11-07

ICT System Support Delivery Options
Support delivery guidelines for Agilent In-circuit Test Systems.

Technical Overview 2012-10-16

PDF PDF 41 KB

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