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- 其他电子测量仪器
  - 在线测试系统 - 3070 ICT

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Apex Expo 2012 展览会 Feb 28 - Mar 1, 2012; San Diego, CA 展览会
i3070 系列产品支持培训 Learn to support the 3070 on the production line - turn-on and debug tests developed by other programmers, run testhead diagnostics and interpret the results, isolate faults (testhead, fixture, test program, printed circuit board...) 课堂培训
使用 Agilent i3070 覆盖扩展技术来改善 PCB 覆盖范围 Original broadcast Sept 29, 2011 网上直播 -- 已存档的
Agilent 3070 Board Test Double Feature Webcast Originally broadcast Feb 24, 2011 网上直播 -- 已存档的
Agilent Board Test User Group Meeting 2013 – Cleveland, OH Cleveland, OH - May 15 & 16, 2013 研讨会
Agilent Medalist Bead Probe Technology Webcast (recorded) 培训资料 2007-01-24
Agilent Repair Tool Tutorial This tutorial is specific to Agilent Repair Tool products operation and programming. 培训资料 2002-06-15	ZIP 15 MB
Boundary Scan Online Training Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk! 培训资料 2010-01-28
Boundary Scan Test Methods for DDR Memories Originally broadcast May 18, 2010 网上直播 -- 已存档的
i3070 UnMuxed User Fundamentals II In this course, test developers learn to customize tests, generate custom test models and receive an introduction to many of the optional test tools available on the i3070. 课堂培训
Improving PCB Test Coverage with Agilent’s i3070 Cover-Extend Technology Original broadcast Sept 29, 2011 网上直播 -- 已存档的
Learn about the latest i3070 ICT productivity tools from us, DeMille Research, and Derby Associates Originally broadcast Aug 24, 2010 网上直播 -- 已存档的
Medalist i3070 Webex Tutorial Series Live and recorded Webex presentations 网上直播 -- 已存档的
Medalist Quality Tool A tutorial is included with the Medalist Quality Tool software. Use the tutorial to gain a basic understanding of the application and ideas on how to use the Agilent Quality Tool to improve yield at your manufacturing facility. 培训资料 2003-07-31	ZIP 4.13 MB
Predictive Test Coverage Tool Webcast – How to Quickly Determine Potential Test Coverage & Strategy Originally broadcast Oct 20, 2010 网上直播 -- 已存档的
Programming Static and Dynamic Data into a I2C EEPROM and Serial Flash on the 3070 Originally broadcast April 13, 2010; webex 网上直播 -- 已存档的
Reduce Test Time, Increase Fault Coverage with the new Medalist i3070 Series 5 and the 8.1 Software Originally broadcast July 13, 2010 网上直播 -- 已存档的
Surviving State Disruptions Caused by Test: the “Lobotomy Problem” Originally broadcast Dec 9, 2010 网上直播 -- 已存档的
What’s happening with IEEE std. 1149.1 Boundary Scan? The IEEE is revamping it, in a big way. What does that mean to test engineers? 网上直播 -- 已存档的