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1-25 of 139

Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method. Application Note 2013-04-12	PDF 1.36 MB
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20 This application note discusses the unique challenges involved in minimizing noise figure. Application Note 2013-01-31	PDF 2.54 MB
Successful Modulation Analysis in 3 Steps This application note presents a planned measurement & troubleshooting sequence consisting of 3 steps: (1) Frequency, frequency & time, (2) Basic digital mod. analysis, and (3) Advanced digital mod. analysis. Application Note 2012-11-21	PDF 3.55 MB Languages English \| 2012-11-21 \| PDF 3.55 MB 日本語 \| 2011-04-28 \| PDF 2.90 MB
Vector Signal Analysis Basics This application note serves as a primer on vector signal analysis. It covers VSA measurement concepts and theory of operation, general vector-modulation analysis and, digital-modulation analysis. Previously known as AN150-15. Application Note 2012-11-21	PDF 4.02 MB Languages English \| 2012-11-21 \| PDF 4.02 MB 中文（简体） \| 2011-02-17 \| PDF 2.80 MB
Impedance and Network Analysis Application List Application Note This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers. Application Note 2012-10-30	PDF 1.11 MB
Noise Figure Uncertainty Calculator The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance. Analysis Tool 2012-10-18
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools. Application Note 2012-10-15	PDF 1.03 MB Languages English \| 2012-10-15 \| PDF 1.03 MB 中文（简体） \| 2011-09-14 \| PDF 1.03 MB
Spectrum and Signal Analysis Pulsed RF Application Note 150-2 This application note is intended as an aid for the operation of spectrum and signal analyzers and the interpretation of the displayed pulse spectra. Application Note 2012-07-05	PDF 12.46 MB Languages English \| 2012-07-05 \| PDF 12.46 MB 日本語 \| 2006-05-08 \| PDF 8.48 MB
Innovative Passive Intermodulation (PIM) and S-parameter Measurement Solution with the ENA This application note introduces the solution that combines PIM and S-parameter measurements by using the vector network analyzer. Application Note 2012-05-09	HTML
10 Hints for Making Successful Noise Figure Measurements (AN 57-3) This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses. Application Note 2011-12-21	PDF 2.03 MB Languages English \| 2011-12-21 \| PDF 2.03 MB 日本語 \| 2001-07-30 \| PDF 1.33 MB
Average Power Sensor Measurement Uncertainty Calculator Measurement Uncertainty Calculator for the Average Power Sensors (N8481A, N8482A, N8485A, N8481A-CFT, N8482A-CFT, N8485A-CFT, 8481D, 8485D, 8487D, R8486D, Q8486D, E4412A, E4413A, E9300A, E9301A, E9304A, E9300B, E9301B, E9300H, E9301H) Application Note 2011-11-30	XLS 76 KB
Load Pull + NVNA = Enhanced X-Parameters for PA Designs With high mismatch and technology-independent large-signal device models. Application Note 2011-09-08	Languages English 中文（简体）
Active Device Characterization in Pulsed Operation Using the PNA-X AN 1408-21 This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion. Application Note 2011-05-17	PDF 3.53 MB Languages English \| 2011-05-17 \| PDF 3.53 MB 日本語 \| 2012-11-07 \| PDF 5.82 MB
Making EMI Compliance Measurements This application note provides an overview of EMI compliance test requirements and measurement approaches. Application Note 2011-03-09	PDF 1.53 MB Languages English \| 2011-03-09 \| PDF 1.53 MB 中文（简体） \| 2011-07-31 \| PDF 2.05 MB 日本語 \| 2011-06-22 \| PDF 2.66 MB
Custom OFDM Signal Generation Using SystemVue This application note describes a new comms standard based on OFDM which is provided by SystemVue 2011 to create both simulation and measurement, with links to the new 89600B VSA software for further demodulation and analysis. Application Note 2010-12-09	PDF 1.72 MB Languages English \| 2010-12-09 \| PDF 1.72 MB 中文（简体） \| 2011-12-09 \| PDF 1.72 MB 日本語 \| 2011-03-04 \| PDF 2.20 MB
Fundamentals of RF and Microwave Noise Figure (AN 57-1) This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure. Application Note 2010-08-05	PDF 864 KB Languages English \| 2010-08-05 \| PDF 864 KB 日本語 \| 2010-08-05 \| PDF 864 KB Pусский \| 2011-01-11 \| PDF 1010 KB
Making Conducted and Radiated Emissions Measurements This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing. Application Note 2010-07-13	PDF 1.90 MB Languages English \| 2010-07-13 \| PDF 1.90 MB 日本語 \| 2010-08-16 \| PDF 3.63 MB
A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals Model memory effects of microwave amplifiers in the case of wideband modulated signals. Application Note 2010-05-05	PDF 616 Bytes
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products. Application Note 2009-09-07	PDF 739 KB Languages English \| 2009-09-07 \| PDF 739 KB 中文（简体） \| 2006-08-01 \| PDF 1.79 MB 日本語 \| 2007-02-05 \| PDF 1.40 MB
Solutions for Characterizing and Designing Linear Active Devices This short application brief discusses how to accurately characterize a devices’ nonlinear behavior. Application Note 2009-08-21	PDF 366 KB Languages English \| 2009-08-21 \| PDF 366 KB 日本語 \| 2009-07-27 \| PDF 1.04 MB
Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer. Application Note 2009-08-14	PDF 387 KB Languages English \| 2009-08-14 \| PDF 387 KB 日本語 \| 2006-11-24 \| PDF 645 KB
Cognitive Radio Algorithm Development and Testing White Paper Cognitive radio technology brings with it new design and performance verification challenges. This paper describes some of these challenges and introduces the cognitive radio algorithm R&D testbed, which uses SystemVue software. Application Note 2009-08-05	PDF 853 KB
Impedance Measurement Handbook Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers. Application Note 2009-06-17	PDF 2.02 MB Languages English \| 2009-06-17 \| PDF 2.02 MB 日本語 \| 2003-10-31 \| PDF 1.70 MB 한국어 \| 2012-07-06 \| PDF 3.64 MB
Fundamentals of RF and Microwave Power Measurements (AN 1449) Agilent's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4). Application Note 2009-06-05
Extension of X-parameters to Include Long-Term Dynamic Memory Effects IEEE MTT-S International Microwave Symposium Digest, Boston Application Note 2009-06-05

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