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226-250 of 1067

S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

N432A Measurement Uncertainty Calculator
Measurement Uncertainty Calculator for the N432A Thermistor Power Meter.

Analysis Tool 2012-03-01

Identifying an Electrical Circuit Using Agilent Wireless Remote Connectivity Solution
Case study on how to use Agilent U1177A IR-to-Bluetooth® adapter with an Android Phone or tablet PC to identify electrical circuit.

Application Note 2012-02-27

Using PrecisionProbe Software on the Infiniium 9000 Series Oscilloscopes
This application note introduces an easier and quicker solution for addressing the loss due to the probing system and its impact on oscilloscope measurements.

Application Note 2012-02-13

Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8)
Due to the inherent limitations of parallel technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments.

Application Note 2012-01-31

Tips and Techniques for Accurate Characterization of 28 Gb/s Designs - Application Note
The worldwide demand for data capacity in networks greatly increases every year, driven by services like cloud computing and Video on Demand.

Application Note 2012-01-27

Practical Temperature Measurements (AN-290)
The purpose of this application note is to explore the more common temperature measurement techniques, and introduce procedures for improving their accuracy.

Application Note 2012-01-26

Making Wideband Measurements Application Note
This paper will discuss using the Agilent PXA signal analyzer as a microwave down converter for an Infiniium oscilloscope or Acqiris digitizer running the 89600 VSA software.

Application Note 2012-01-24

EMI Pre-Compliance Testing - Application Note
X-Series signal analyzers with the EMI measurement application offer a cost-effective pre-compliance testing solution.

Application Note 2012-01-16

Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.

Application Note 2012-01-12

Using Agilent Command Expert with Microsoft® Excel - Application Note
Learn how easy it is to control instruments from Excel using Agilent’s free software Command Expert!

Application Note 2012-01-12

How to measure 5nsec rise fall time in RF pulsed power amplifier using 8990B PPA
In pulsed Radar power amplifier design, manufacturing or maintenance, one of the key measurement parameters is the rise/fall time. Learn how to use the 8990B PPA to measure 5ns

Application Note 2011-12-23

High-Power Measurement Using The E5072A Network Analyzer Application Note
This application note describes how to make high-power measurements with unique functions of the E5072A network analyzer.

Application Note 2011-12-23

Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters
Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.

Application Note 2011-12-22

Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface
Agilent continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.

Application Note 2011-12-22

10 Hints for Making Successful Noise Figure Measurements (AN 57-3)
This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses.

Application Note 2011-12-21

Scalar Network Analysis with U2000 Series USB Power Sensors - Application Note
The purpose of this AN is to explain how to make accurate scalar network analysis using: a) U2000 series USB power sensors b) ESG/MXG/PSG signal generators c) broadband couplers d) power splitters

Application Note 2011-12-08

Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests
Agilent Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Agilent E5071C ENA Network Analyzer Option TDR

Application Note 2011-12-01

How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification - Application Brief
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

Evaluating Fluorescent Lighting Interference on Passive UHF RFID Systems
This paper highlights how the use of N934xC handheld spectrum analyzers are an effective way to determine if the effects of fluorescent lighting is impacting an RFID system

Application Note 2011-11-30

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

Application Note 2011-11-29

Connecting and Configuring JMR RAID to work with the Agilent M9392A-White Paper
The M9392A Streaming Application Note details a new tool to overcome the challenges of capturing gapless data

Application Note 2011-11-11

How Offset, Dynamic Range and Compression Affect Measurements - Application Note
This application note will clearly present how signal offset and oscilloscope/probe offset interact with regards to the dynamic range of the probe amps.

Application Note 2011-11-02


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