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Interference Testing with Handheld Spectrum Analyzers Application Note
This application note describes the techniques and procedures for interference testing in a wireless environment using the Agilent family of N934xC/N9340B handheld spectrum analyzers.

Application Note 2011-10-11

Procedures to Verify and Locate Interference Application Note
This application note looks at the process and techniques for measuring, verifying and locating wireless interference using the portable N934xC handheld spectrum analyzers.

Application Note 2011-10-11

Troubleshooting VFDs with Low Pass Filter - Application Note
Technicians constantly face the challenge of obtaining accurate voltage and frequency measurement that tallies with the readings shown on the VFD control panel display. With Agilent’s handheld multimeter that is equipped with a switchable 1-kHz low pass filter, technicians do not need to guess the VFD output anymore

Application Note 2011-10-05

PDF PDF 391 KB
Gaining Deeper Insights into Dynamic BTS/UE Signals with WLA
This application note introduces link operation, wireless link analysis, a graphical approach to WLA, dynamic measurements, and additional capabilities specific to the analysis of LTE devices.

Application Note 2011-10-04

PDF PDF 214 KB
7 Practices to Prevent Damaging Power Meter Power Sensors - Application Note
Mishandling of power meter power sensor will caused the malfunction of these instrument. Practices to protect power meter power sensor from faulty is to prolong the life span of these instruments.

Application Note 2011-09-30

PDF PDF 479 KB
1mW 50 MHz Power Reference Measurement with the N432A Thermistor Power Meter - Application Note
Explains the application procedure on how to use the N432A with the thermistor mount to measure the power reference of power meters.

Application Note 2011-09-30

PDF PDF 282 KB
Understanding The Oscilloscope Jitter Specifi cation
Jitter is defined as the unwanted phase modulation of a digital signal, and is considered one of the most important specifications for measuring a device's quality.

Application Note 2011-09-30

PDF PDF 581 KB
M9392A Streaming Application Note
How to get the most from Agilent’s M9392A PXI Vector Signal Analyzer (including the M9202A IF digitizer) with 100 MHz streaming option

Application Note 2011-09-28

Techniques for Higher Accuracy Optical Measurements
Learn techniques for high accuracy optical measurements using System Impulse Response Correction

Application Note 2011-09-21

Load Pull + NVNA = Enhanced X-Parameters for PA Designs
With high mismatch and technology-independent large-signal device models.

Application Note 2011-09-08

Advanced Techniques for PCIe 3.0 Receiver Testing-Paper - Application Note
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Application Note 2011-09-01

PDF PDF 2.20 MB
Measuring Power BJT Electrical Characteristics using the B1505A - Application Note
B1505A can measure the typical DC and capacitance parameters of power BJT devices.

Application Note 2011-08-30

PDF PDF 493 KB
Evaluating X-parameter Models for Active Device Nonlinear Behavior (AN 1408-22)
This AN examines three different modeling techniques that can be used to capture nonlinear behavior in a PA: the more conventional S2D and P2D, and the more recently commercialize X-parameter model.

Application Note 2011-08-29

PDF PDF 625 KB
Measuring Power MOSFET Electrical Characteristics using the B1505A
This application note explains how to use the B1505A to measure the typical DC and capacitance parameters of power MOSFET devices.

Application Note 2011-08-22

PDF PDF 651 KB
Oscilloscope Selection Tip 1: Bandwidth
Select a scope that has sufficient bandwidth to accurately capture the highest frequency content of your signals. Tip #1 in a series of 12 tips to help you choose your next oscilloscope.

Application Note 2011-08-22

PDF PDF 935 KB
Oscilloscope Selection Tip 5: Waveform Update Rate
Select a scope that has a fast enough waveform update rate to capture random and infrequent events to help you debug your designs faster. This is Tip#5 of a 12 part series.

Application Note 2011-08-22

PDF PDF 598 KB
Oscilloscope Selection Tip 2: Sample Rate
Select a scope that has a maximum specified sample rate that is fast enough to deliver the scope's specified real-time bandwidth. Tip #2 in a series of 12 to help you choose your next oscilloscope.

Application Note 2011-08-22

Oscilloscopes and ENOB
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

Application Note 2011-08-08

Solutions for Using a Frequency Counter to Measure Phase Noise Close to a Carrier Signal
A local oscillator (LO) is the heart of any modern radar, electronic warfare or communication system. See how you can use this to your advantage.

Application Note 2011-08-01

Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.

Application Note 2011-07-28

Practices to Optimize Power Meter/Sensor Speed for Shorter Test Time - Application Note
This application note describes some useful tips on how to effectively minimize test times while obtaining power measurements.

Application Note 2011-07-14

PDF PDF 618 KB
Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.

Application Note 2011-07-08

PDF PDF 1.77 MB
How to Select a Handheld DMM That is RIGHT for You - Application Note
To assist you in choosing a handheld DMM, this application note looks at some of the device's key attributes: handheld specifications, basic functionality, and features targeted for specific industrial applications. It also provides information on the design and features of Agilent handheld DMMs to guide you in your selection process.

Application Note 2011-07-06

Component Testing Using an Oscilloscope with Integrated Waveform Generator
This application note illustrates methods for testing components using an oscilloscope and waveform generator.

Application Note 2011-06-22

PDF PDF 579 KB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

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