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226-250 of 981
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Why Migrate from HP/Agilent 432A/B to Agilent N432A Thermistor Power Meter?
Seven Reasons to Migrate from 432A/B to N432A Thermistor Power Meter.
Application Note 2010-05-11 |
PDF
3.86 MB
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A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
Model memory effects of microwave amplifiers in the case of wideband modulated signals.
Application Note 2010-05-05 |
PDF
616 Bytes
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Stimulus-Response Testing for LTE Components
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.
Application Note 2010-05-03 |
PDF
2.86 MB
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Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.
Application Note 2010-04-28 |
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Accuracy Verification of E5071C-TDR Using a NIST Traceable Standard
This application note verifies the measurement accuracy of the E5071C-TDR by comparing the measurement result of the E5071C-TDR with the simulation results based on the NIST traceable data.
Application Note 2010-04-21 |
PDF
1.70 MB
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Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.
Application Note 2010-04-07 |
PDF
486 KB
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Solutions for Characterizing Complex and Multi-Stage Circuits
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.
Application Note 2010-04-07 |
PDF
577 KB
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AN B1500A-2 Migrating from the Agilent 4155C and 4156C to the Agilent B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.
Application Note 2010-04-02 |
PDF
944 KB
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Comparison of Measurement Performance Between VNA and TDR Oscilloscope
This white paper provides a comparison of measurement performance between a vector network analyzer and TDR oscilloscope.
Application Note 2010-03-26 |
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AN B1500-16 A Complete Solution for CMOS Device Electrical Characterization
This application note gives an overview of the B1500A's key features and it goes on to show how the B1500A is a complete solution for CMOS device electrical characterization.
Application Note 2010-03-24 |
PDF
228 KB
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AN B1500-15 Ultra Low Current DC MOSFET Characterization at the Wafer Level
This application note describes how to precisely evaluate sub-threshold characteristics of a MOSFET device using B1500A’s ultra low current measurement capability
Application Note 2010-03-23 |
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Improved Throughput in Network Analyzer Applications (AN 1287-5)
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to
improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...
Application Note 2010-03-15 |
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Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.
Application Note 2010-03-04 |
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2.68 MB
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Using Noise Floor Extension in the PXA Signal Analyzer
With sufficient processing and other technical innovations, the noise power in a signal analyzer can be modeled and subtracted from measurement results to reduce the effective noise level.
Application Note 2010-02-25 |
PDF
225 KB
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AN B1505-3 Precision Power Device Evaluation at 40 Amps
This application note introduces 40A IV measurement application for power devices by using two HCSMUs installed in the B1505A.
Application Note 2010-02-24 |
PDF
200 KB
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Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.
Application Note 2010-02-01 |
PDF
77 KB
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Correlation Between 86100C and E5071C-TDR
This application note describes the correlation between the 86100C TDR oscilloscope and the E5071C ENA network analyzer option TDR.
Application Note 2010-01-28 |
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High Power Amplifier Measurements Using Agilent's Nonlinear Vector Network Analyzers AN 1408-19
This application note discusses the unique challenges involved in testing high-power devices using Agilent's N5242A nonlinear vector network analyzer(NVNA).
Application Note 2010-01-26 |
PDF
582 KB
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AN B1505-2 Next Generation Curve Tracer Revolutionizes Failure Analysis
This application note describes how the B1505A enable for checking device operation and failure analysis using curve tracer mode.
Application Note 2010-01-08 |
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1.40 MB
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Measuring ACLR Performance in LTE Transmitters
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.
Application Note 2010-01-07 |
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Understanding X-parameter Nonlinear Measurements
This “Solutions for Securing Successful First-Pass Component Design“ application brief discusses the basics of X-Parameters and non-linear measurements using the PNA-X and ADS software.
Application Note 2010-01-06 |
PDF
373 KB
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Power Toolbox for Embedded System Design, Dynamic Current Profiling
This is the 2nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; focusing on dynamic current profiling.
Application Note 2009-12-15 |
PDF
768 KB
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Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.
Application Note 2009-12-07 |
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Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.
Application Note 2009-12-02 |
PDF
250 KB
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PNA - Banded Millimeter-Wave Measurements (AN 1408-15)
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.
Application Note 2009-11-24 |
PDF
1.95 MB
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