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Low Frequency RFID Tag Characterization - Application Note
This application note introduces how to measure the resonance frequency of an RFID tag with the Agilent N9322C basic spectrum analyzer (BSA) easily.
어플리케이션 노트 2013-05-16 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
어플리케이션 노트 2013-05-10 |
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Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.
어플리케이션 노트 2013-05-07 |
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Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.
어플리케이션 노트 2013-04-30 |
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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.
어플리케이션 노트 2013-04-29 |
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Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Agilent E5071C ENA Network Analyzer Option TDR.
어플리케이션 노트 2013-04-24 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
어플리케이션 노트 2013-04-12 |
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PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note
This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis
어플리케이션 노트 2013-04-08 |
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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
어플리케이션 노트 2013-04-05 |
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Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
어플리케이션 노트 2013-04-03 |
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Oscilloscope Selection Tip 3: Acquisition Memory
Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution.
어플리케이션 노트 2013-04-02 |
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CAN Eye-diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.
어플리케이션 노트 2013-04-01 |
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Making Reflection Measurements - Application Note
The N9322C supports to measure characteristics of antenna, RFID tags, or RF Tx modules, such as their return loss, insertion loss, and VSWR with a tracking generator and reflection measurement.
어플리케이션 노트 2013-03-29 |
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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.
어플리케이션 노트 2013-03-27 |
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Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured
어플리케이션 노트 2013-03-27 |
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Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.
어플리케이션 노트 2013-03-27 |
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Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note
One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms.
어플리케이션 노트 2013-03-27 |
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Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.
어플리케이션 노트 2013-03-14 |
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Making Stimulus/Response Measurements - Application Note
The N9322C basic spectrum analyzer is a dual use RF analyzer, which performs frequency-selective power analysis and component-level characterization when used with the optional tracking generator.
어플리케이션 노트 2013-03-14 |
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Infiniium Oscilloscopes with 89600B VSA Software - Application Note
This application note describes the characteristics, setup, and operation of an Infiniium Series oscilloscope with 89600 VSA software to provide broadband vector signal analysis.
어플리케이션 노트 2013-03-08 |
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Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.
어플리케이션 노트 2013-03-06 |
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Techniques for Time Domain Measurements - Application Note
This application note will introduce time domain and DTF measurement techniques for identifying the location and relative amplitudes of discontinuities while operating in the field.
어플리케이션 노트 2013-03-05 |
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DVB-T and DVB-T2 Transmitter Test Challenges - Application Note
This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of transmitters for these systems.
어플리케이션 노트 2013-02-27 |
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Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis
어플리케이션 노트 2013-02-21 |
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Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode
어플리케이션 노트 2013-02-20 |
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