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Agilent Veranstaltungs-Webseite für Deutschland
Willkommen zur neuen Agilent Veranstaltungs-Webseite für Deutschland

Seminar

Embedded Design Seminar
Embedded Design Seminar - Event focusing on Embedded design, covering serial busses, compliance test, logic analysis

Seminar

Embedded World 2012
The embedded world Exhibition&Conference is the meeting-place of the international embedded community.

Tradeshow

Impedance Seminar
B2B of impedance measurements B2B netzwork analysis B2B impedance measurements in time domain

Seminar

Test and Measurement Course Calendar
Calendar of Test and Measurement courses scheduled in your region. Course details, dates, and locations.

Classroom Training

Web-Seminar: Debugging serieller Busse mithilfe eines Oszilloskops der Familie InfiniiVision
Debugging serieller Low-Speed-Busse wie I2C, SPI, RS232, CAN usw. – Dieses Web-Seminar erläutert die Grundlagen einiger serieller Busse und vergleicht verschiedene Decodier-Technologien...

Webcast - recorded

Wireless Seminar
Wireless Day

Seminar

.All Webcast On-Demand Recordings
Access the free, On-Demand (recorded) webcasts

Webcast

100G TX Designs - Tips & Techniques for Accurate Characterization Webcast
Original broadcast on February 27, 2013

Webcast - recorded

12 Tips on How to Select Your Next Oscilloscope
In this webcast we will cover 12 topics for you to consider before selecting your next general purpose oscilloscope: from bandwidth, triggering and update rate to serial buses and probing. Providing trade-offs you can make to fit your budget.

Webcast - recorded

12 tips on how to select your next oscilloscope
In this webinar we cover 12 topics for you to consider before selecting your next general purpose oscilloscope: from bandwidth, triggering and update rate to serial buses and probing. Providing trade-offs you can make to fit your budget.

Webcast - recorded

1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast

1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices.
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast - recorded

3G Technology Overview
This 2-day course will introduce engineers to the concepts of third generation cellular technologies.

Classroom Training

3GPP LTE Standards Update: Release 11, 12 and Beyond
Original broadcast October 25, 2012

Webcast - recorded

802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA
This web seminar shows you how the Agilent 8990B peak power analyzer can be used for 802.11ac testing WLAN transmitter testing.

Webcast - recorded

86100C/83496B and E5052B SSA-J Phase Noise e-Seminar
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Seminar Materials 2007-04-26

89600 Series Vector Signal Analyzer Basics
This is a complete course on the theory and operation of the 89600 series Vector Signal Analyzer (VSA), including an understanding of frequency, time, and modulation domain measurements.

Classroom Training

89600 Vector Signal Analyzer Course
This course is recommended to first-time users of the 89600 Vector Signal Analyzer.

Classroom Training

8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast
Original broadcast April 25, 2013

Webcast - recorded

A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
Originally broadcast October 28, 2010

Webcast - recorded

Accelerating DDR4 Debug and Protocol Validation Webcast
Original webcast February 26, 2013

Webcast - recorded

Accelerating USB 3.0 Product Development
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

Webcast - recorded

Accelerating USB 3.0 Protocol Development
Original broadcast June 27, 2012

Webcast - recorded

Accurate Mixer Measurements Using Multi-tone X-parameter Models
IMS 2010 MicroApps presentation by Mihai Marcu and Radoslaw M. Biernacki

Seminar Materials 2010-05-26

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