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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

PDF PDF 2.02 MB
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Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode

Application Note 2013-05-07

PDF PDF 682 KB
Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2013-05-07

PDF PDF 2.90 MB
Oscilloscope Selection Tip 3: Acquisition Memory
Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution.

Application Note 2013-04-02

PDF PDF 682 KB
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CAN Eye-diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2013-04-01

PDF PDF 2.64 MB
Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note
One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms.

Application Note 2013-03-27

PDF PDF 1.67 MB
Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured

Application Note 2013-03-27

PDF PDF 2.63 MB
Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.

Application Note 2013-03-27

PDF PDF 1.48 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2013-03-27

PDF PDF 1.28 MB
Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.

Application Note 2013-03-14

PDF PDF 1.71 MB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2013-03-06

PDF PDF 1.41 MB
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Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
The USB 2.0 serial interface has been rapidly replacing older RS-232 serial interfaces in embedded designs.

Application Note 2013-01-24

PDF PDF 1.52 MB
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Accelerate FPGA Debug using High Bandwidth Mixed Signal Oscilloscopes - Application Note
This application note discusses both digital and analog debug of state-of-the-art FPGAs using a high bandwidth mixed signal oscilloscope.

Application Note 2012-12-20

PDF PDF 2.36 MB
Tips for Making Low Current Measurements with an Oscilloscope and Current Probe
An oscilloscope and a clamp-on current probe provide an easy way to make current measurements without necessarily breaking the circuit.

Application Note 2012-12-10

PDF PDF 1.64 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity: How to Make the Most Accurate Digital Measurements When you select an oscilloscope for accurate, high-speed digital measurements, sampling fidelity can often be more important than maximum sample rate.

Application Note 2012-11-11

PDF PDF 1.56 MB
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FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Agilent provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

Application Note 2012-11-09

PDF PDF 2.53 MB
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Oscilloscopes in Aerospace/Defense Debugging ARINC 429 serial buses
Agilent’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.

Application Note 2012-11-08

PDF PDF 1.32 MB
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Evaluating Oscilloscope Bandwidths for your Application
This application note provides some helpful hints on how to select an oscilloscope with the appropriate bandwidth for analog and digital applications.

Application Note 2012-11-08

PDF PDF 2.80 MB
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Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details
The quality of your oscilloscope's display can make a big difference in your ability to troubleshoot your designs effectively.

Application Note 2012-11-08

PDF PDF 6.37 MB
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Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses
Agilent's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

Application Note 2012-11-08

PDF PDF 3.64 MB
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Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note
This application note discusses the statistical principles that apply to the QA process and the evolution of Six Sigma efficiency-defined as achieving a defect rate of 3.4 per million or less.

Application Note 2012-11-07

PDF PDF 2.20 MB
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MIL-STD 1553 Eye-diagram Mask Testing - Application Note
Eye-diagram mask testing can be performed on differential MIL-STD 1553 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2012-10-31

PDF PDF 2.44 MB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

Application Note 2012-10-31

PDF PDF 2.69 MB
Oscilloscope Memory Architectures – Why All Acquisition Memory is Not Created Equal
Depending on your oscilloscope architecture there may be very real tradeoffs in more acquisition memory.

Application Note 2012-10-26

PDF PDF 957 KB
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