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- 어플리케이션 노트
- 어플리케이션 노트 (172)
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오실로스코프, 분석기, 미터
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- USB Modular Oscilloscopes (6)
- InfiniiVision 2000 X-시리즈 경제형 DSO 및 MSO 오실로스코프 (12 모델) (17)
- InfiniiVision 3000 X-시리즈 경제형 DSO 및 MSO 오실로스코프(14 모델) (19)
- InfiniiVision 4000 X-시리즈 DSO 및 MSO 오실로스코프 (10)
- 1000 시리즈 경제형 오실로스코프 (6 모델) (3)
- 5000 시리즈 휴대용 오실로스코프 (16)
- MegaZoom III 기술 기반의 애질런트 6000 시리즈 오실로스코프 (17)
- 6000L 시리즈 로-프로파일 오실로스코프 (13)
- InfiniiVision 7000B 시리즈 휴대형 MSO 및 DSO 오실로스코프 (14모델) (15)
- Infiniium 9000 시리즈 MSO 및 DSO 오실로스코프 (8 모델) (9)
- Infiniium 9000 H-시리즈 고화질 오실로스코프 (1)
- Infiniium 90000A DSO/DSA 시리즈 고성능 오실로스코프(12가지 모델) (35)
- Infiniium 90000 X-시리즈 고성능 오실로스코프 (33)
- Infiniium 90000 Q-시리즈 오실로스코프 (4)
- 86100 DCA Wideband Sampling Oscilloscopes (40)
- High Performance Oscilloscope- Digitizers (1)
- 오실로스코프 프로브 (26)
- 오실로스코프 소프트웨어 및 어플리케이션 (78)
- Oscilloscope Accessories (6)
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오실로스코프
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오실로스코프, 분석기, 미터
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1-25 / 172
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Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.
어플리케이션 노트 2013-05-31 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
어플리케이션 노트 2013-05-10 |
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Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode
어플리케이션 노트 2013-05-07 |
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Using Microwave Switches When Testing High Speed Serial Digital Interfaces - Application Note
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.
어플리케이션 노트 2013-05-07 |
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Oscilloscope Selection Tip 3: Acquisition Memory
Tip 3: Select a scope that has sufficient acquisition memory to capture your most complex signals with high resolution.
어플리케이션 노트 2013-04-02 |
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CAN Eye-diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.
어플리케이션 노트 2013-04-01 |
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Time-Saving Features in Economy Oscilloscopes Streamline Test - Application Note
Features like integrated function generators, large displays, fast update rates and mixed signal capabilities are now available in oscilloscopes to save valuable time in the design and debug process.
어플리케이션 노트 2013-03-27 |
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Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured
어플리케이션 노트 2013-03-27 |
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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.
어플리케이션 노트 2013-03-27 |
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Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note
One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms.
어플리케이션 노트 2013-03-27 |
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Three Compelling Reasons for Deep Acquisition Memory
This app note discusses deep memory's value. While acquisition memory depth is often used as a primary purchase consideration, the associated benefits require additional thought to fully appreciate.
어플리케이션 노트 2013-03-14 |
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Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.
어플리케이션 노트 2013-03-06 |
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Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note
The new N2820A Series high-sensitivity current probes from Agilent Technologies address the need for high-sensitivity current measurements with a wide dynamic range.
어플리케이션 노트 2013-02-26 |
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Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis
어플리케이션 노트 2013-02-21 |
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Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
The USB 2.0 serial interface has been rapidly replacing older RS-232 serial interfaces in embedded designs.
어플리케이션 노트 2013-01-24 |
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Accelerate FPGA Debug using High Bandwidth Mixed Signal Oscilloscopes - Application Note
This application note discusses both digital and analog debug of state-of-the-art FPGAs using a high bandwidth mixed signal oscilloscope.
어플리케이션 노트 2012-12-20 |
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Tips for Making Low Current Measurements with an Oscilloscope and Current Probe
An oscilloscope and a clamp-on current probe provide an easy way to make current measurements without necessarily breaking the circuit.
어플리케이션 노트 2012-12-10 |
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FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Agilent provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.
어플리케이션 노트 2012-11-09 |
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Oscilloscopes in Aerospace/Defense Debugging ARINC 429 serial buses
Agilent’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.
어플리케이션 노트 2012-11-08 |
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Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses
Agilent's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.
어플리케이션 노트 2012-11-08 |
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Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note
This application note discusses the statistical principles that apply to the QA process and the evolution of Six Sigma efficiency-defined as achieving a defect rate of 3.4 per million or less.
어플리케이션 노트 2012-11-07 |
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ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.
어플리케이션 노트 2012-10-31 |
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MIL-STD 1553 Eye-diagram Mask Testing - Application Note
Eye-diagram mask testing can be performed on differential MIL-STD 1553 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.
어플리케이션 노트 2012-10-31 |
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Switch Mode Power Supply Measurements
This app note gives instructions on how to perform a broad range of power analysis measurements on your SMPS and how to perform these measurements when using Measurements Training Kit as the DUT.
어플리케이션 노트 2012-10-26 |
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Oscilloscope Memory Architectures – Why All Acquisition Memory is Not Created Equal
Depending on your oscilloscope architecture there may be very real tradeoffs in more acquisition memory.
어플리케이션 노트 2012-10-26 |
