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1-25 of 1158
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Low Frequency RFID Tag Characterization - Application Note
This application note introduces how to measure the resonance frequency of an RFID tag with the Agilent N9322C basic spectrum analyzer (BSA) easily.
Application Note 2013-05-16 |
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PENPROBE.CA RF Probe-test Solution up to 110GHz
Yokowo Co., Ltd.
Solution Brief 2013-05-13 |
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Download Your Free Copies of the Latest Power of X Application Notes
Learn about the Power of X – Agilent’s suite of test products that help you get your innovative, higher-performing designs to market before your competition.
Promotional Materials 2013-05-13 |
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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Application Note 2013-05-10 |
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A0040A Optical Noise Analyzer
A0040A Optical Noise Analyzer enables to capture optical frequency noise characteristics as power spectrum density by the combination of SYCATUS’s unique method and Agilent X-series signal analyzer.
Brochure 2013-05-10 |
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Download Your Free Copies of the Latest Power of X Application Notes
Learn about the Power of X – Agilent’s suite of test products that help you get your innovative, higher-performing designs to market before your competition.
Promotional Materials 2013-05-06 |
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Why Migrate to the Agilent M1970 Series Smart Mixers?
Get the best high frequency measurement performance from your PXA with an M1970 Series smart mixer. Together, smart mixers and the PXA give you clearer insight into your millimeter wave designs.
Technical Overview 2013-05-02 |
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Waveguide Harmonic Mixers, M1970E/V/W 50 GHz to 110 GHz
This technical overview describes Agilent's M1970E/V/W waveguide harmonic mixers (smart mixers). Specifications and ordering information are included.
Technical Overview 2013-05-01 |
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Radar Test Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.
Application Note 2013-04-30 |
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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.
Application Note 2013-04-29 |
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RF Emissions Testing – EMSEC Solutions Inc. (ESI)
RF Emissions Testing Solution from ESI and Agilent.
Solution Brief 2013-04-24 |
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Real-Time Spectrum Analyzer (RTSA) Videos on YouTube
Explore YouTube for videos on the Real-Time Spectrum Analyzer (RTSA).
Demo 2013-04-23 |
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N6820ES Signal Surveyor 4D Software - Technical Overview
Surveyor 4D is spectrum monitoring software capable of automating signal search, location and survey. Its powerful triggering and alarm functions are unrivaled in the commercial monitoring industry.
Technical Overview 2013-04-19 |
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M9392A PXI Microwave Vector Signal Analyzer - Configuration Guide
The M9392A configuration guide is a quick reference for configuring a PXI microwave vector signal analyzer.
Configuration Guide 2013-04-15 |
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Spectrum Management for Efficient Bandwidth Allocation - X-COM
Spectrum Management Solutions for Efficient Bandwidth Allocation from X-COM and Agilent
Solution Brief 2013-04-13 |
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Noise Figure Measurement Accuracy - The Y-Factor Method - Application Note
Noise figure is a key performance parameter in many RF systems. This application note covers many topics related to noise figure measurements including the Y-factor method.
Application Note 2013-04-12 |
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PXIe Data Streaming for RF Interference Analysis - X-COM
PXIe Data Streaming Solution for RF Interference and Spectrum Analysis from X-COM and Agilent
Solution Brief 2013-04-09 |
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RF Capture and Playback for Improved Communications Jamming - X-COM
RF Capture and Playback Solutions for Improved Communications Jamming from X-COM and Agilent
Solution Brief 2013-04-08 |
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RF Spectrum Recording and Analysis - X-COM
RF Capture and Storage Solutions and Spectrum Analysis Software from X-COM and Agilent
Solution Brief 2013-04-08 |
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Measuring Dielectric Properties using Agilent's Materials Measurement Solutions - Brochure
Quick guide for Agilent materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.
Brochure 2013-04-05 |
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Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
Application Note 2013-04-05 |
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M9392A Soft Front Panel Help System
(Extract this zipped file to a local drive.) Help system for the M9392A PXI Vector Signal Analyzer Soft Front Panel (SFP). Includes product introduction, tour of the SFP UI, how-to procedures (cabling, self test, operational check, field calibration), and troubleshooting.
Help File 2013-04-04 |
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M9392A IVI Driver Reference
(Extract this zipped file to a local drive.) Reference for the M9392A PXI Vector Signal Analyzer IVI driver. Includes detailed API documentation of all driver functions.
Help File 2013-04-04 |
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N9020A MXA Signal Analyzer - Configuration Guide
This X-Series MXA configuration guide will help you determine which options, measurement applications, accessories, & services to include with a new MXA or to add as upgrades to an existing MXA.
Configuration Guide 2013-04-02 |
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N9010A EXA X-Series Signal Analyzer - Configuration Guide
This X-Series EXA configuration guide will help you determine which options, measurement applications, accessories, & services to include with a new EXA or to add as upgrades to an existing EXA.
Configuration Guide 2013-04-02 |
