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1-25 of 34
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Resonance Method Strip Line Type Dielectric Constant and Dielectric Loss Tangent Measurement System
Keycom Corp.
Soluzioni 2013-05-13 |
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Permittivity and Dielectric Loss Tangent Measurement System for Millimeter Wave for sheet and ultra-
KEYCOM Corp.
Soluzioni 2013-05-13 |
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PENPROBE.CA RF Probe-test Solution up to 110GHz
Yokowo Co., Ltd.
Soluzioni 2013-05-13 |
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Multiband Passive Intermodulation Testing – Power Technology Solutions (PTS)
Multiband Passive Intermodulation Testing from PTS and Agilent.
Soluzioni 2013-04-13 |
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Microwave Measurement and Calibration - ATE Systems
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.
Soluzioni 2013-03-20 |
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Aerospace/Defense RF Coaxial Cable Test - Beta LaserMike
Aerospace/Defense RF Coaxial Cable Test from Beta LaserMike and Agilent.
Soluzioni 2013-01-26 |
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USB 3.0 Cable Testing - BitifEye
USB 3.0 Cable Testing Solution from BitifEye and Agilent.
Soluzioni 2013-01-15 |
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Automated LAN Cable Test System - Beta LaserMike
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.
Soluzioni 2012-12-20 |
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Impedance Matching for High Power Devices - Maury Microwave
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent
Soluzioni 2012-12-04 |
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X-Parameter Measurements - Maury Microwave
X-Parameter (large signal S-parameter) measurements from Maury Microwave and Agilent
Soluzioni 2012-12-04 |
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Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent
Soluzioni 2012-12-04 |
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Pulsed Measurement of Active Device IV Characteristics and S-Parameters - Maury Microwave
Pulsed Measurement of Active Device IV Characteristics and S-Parameters from Maury Microwave and Agilent
Soluzioni 2012-12-04 |
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Noise Parameter Measurements - Maury Microwave
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Agilent
Soluzioni 2012-12-04 |
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Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Agilent.
Soluzioni 2012-10-12 |
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X-Parameter Design Simulation Models - Modelithics
X-Parameter Design Simulation Models from Modelithics and Agilent.
Soluzioni 2012-10-02 |
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NIST Accredited Calibration of Power Sensors – Cal Lab
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.
Soluzioni 2012-07-02 |
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RF Test Solutions – WinSoft
Military and Commercial RF Test Solutions from WinSoft and Agilent.
Soluzioni 2012-05-14 |
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Spherical Near-Field Antenna Measurements – NSI
Spherical Near-Field Antenna Measurement Solution from NSI and Agilent.
Soluzioni 2012-05-11 |
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Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Agilent.
Soluzioni 2012-05-09 |
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HDMI Cable Testing - BitifEye
HDMI Cable Testing Solution from BitifEye and Agilent.
Soluzioni 2012-05-09 |
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TR Module (Transmit Receive Module) Testing - AAI
TR Module (Transmit Receive Module) Test Solution from AAI and Agilent
Soluzioni 2012-04-23 |
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Satellite Test Solution – AAI
Satellite Payload and Panel Test Solution from AAI and Agilent Technologies
Soluzioni 2012-04-23 |
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Millimeter Wave Frequency Extension for Vector Network Analyzers – Farran Technology
Millimeter wave frequency extension solutions for vector network analyzers from Farran Technology and Agilent
Soluzioni 2012-03-29 |
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RF Module Test Solution for Speed, Accuracy and Performance – Auriga Microwave
RF Module Test Solution for Speed, Accuracy and Performance from Auriga Microwave and Agilent
Soluzioni 2012-03-01 |
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Millimeter-wave S-parameter measurements – OML
Millimeter-wave S-parameter measurements from OML and Agilent
Soluzioni 2012-02-24 |
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