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Electronic Measurement

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RF Test Solutions – WinSoft
Military and Commercial RF Test Solutions from WinSoft and Agilent.

Soluzioni 2014-05-14

Millimeter-wave S-parameter measurements – OML
Millimeter-wave S-parameter measurements from OML and Agilent

Soluzioni 2014-05-07

Magnetic Material Characterization – KEYCOM
Magnetic Material Characterization Solution from KEYCOM and Agilent.

Soluzioni 2014-04-30

X-Parameter Design Simulation Models - Modelithics
X-Parameter Design Simulation Models from Modelithics and Agilent.

Soluzioni 2014-04-30

Millimeter Wave Frequency Extension for Vector Network Analyzers – Farran Technology
Millimeter wave frequency extension solutions for vector network analyzers from Farran Technology and Agilent

Soluzioni 2014-04-29

NIST Accredited Calibration of Power Sensors – Cal Lab
NIST Accredited Calibration of Power Sensors, Attenuators and Power Splitters from Cal Lab and Agilent.

Soluzioni 2014-04-16

Real-Time Printed Circuit Board EMC Measurement - EMSCAN
Real-Time Printed Circuit Board Electromagnetic Compatibility Measurement from EMSCAN and Agilent

Soluzioni 2014-04-16

Low Cost Antenna Test – Eretec Inc.
Low Cost Antenna Test Solution from Eretec and Agilent

Soluzioni 2014-04-16

Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Agilent

Soluzioni 2014-04-16

On-Wafer High Power Load Pull Measurements – bsw TestSystems
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Agilent

Soluzioni 2014-04-16

Single Connection Passive Intermodulation and S-Parameter Measurements - ACEWAVETECH
Single Connection Passive Intermodulation and S-Parameter Measurements – ACEWAVETECH and Agilent

Soluzioni 2014-04-09

Automated LAN Cable Test System - Beta LaserMike
Automated LAN Cable Testing Solution from Beta LaserMike and Agilent.

Soluzioni 2014-04-09

Microwave Measurement and Calibration - ATE Systems
Microwave Measurement and Calibration Solution from ATE Systems and Agilent.

Soluzioni 2014-04-09

X-Parameter Measurements - Maury Microwave
X-Parameter (large signal S-parameter) measurements from Maury Microwave and Agilent

Soluzioni 2014-04-02

Millimeter-Wave Noise Figure and Noise Parameter Measurements – Maury Microwave
Millimeter-Wave Noise Figure and Noise Parameter Measurements from Maury Microwave and Agilent.

Soluzioni 2014-04-02

Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Agilent

Soluzioni 2014-04-02

Impedance Matching for High Power Devices - Maury Microwave
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Agilent

Soluzioni 2014-04-02

Noise Parameter Measurements - Maury Microwave
Noise Parameter vs Noise Figure Measurement from Maury Microwave and Agilent

Soluzioni 2014-04-01

On-Wafer SOLT Calibration Using 4-port PNA-L Network Analyzers - Application Note
This documentation is intended for on-wafer applications using the 4-port, 20 GHz, PNA-L network analyzer with two dual probes to achieve full 4-port on-wafer calibrations manually. This application note provides the step-by-step instructions needed to set up a calibration kit in order to perform a 4-port SOLT (Short-Open-Load-Thru) calibration using only three thrus.

Application Note 2014-02-06

Accessories Selection Guide For Impedance Measurements - Selection Guide
This selection guide introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers.

Selection Guide 2014-01-24

Spectrum Analyzer and Signal Analyzer - Selection Guide
Agilent offers a wide range of spectrum and signal analyzers, from DC to 325 GHz and beyond, designed to accurately measure frequency, amplitude, and modulation.

Selection Guide 2013-12-07

Agilent Technologies Engineers Author X-Parameters* Book
Agilent Technologies Engineers Author X-Parameters* Book

Press Materials 2013-10-30

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20
This application note discusses the unique challenges involved in minimizing noise figure.

Application Note 2013-01-31

PDF PDF 2.54 MB
EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA

Article 2012-11-30

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