Hable con un experto

Technical Support

Test y Medida

Find by Product Model Number: Examples: 34401A, E4440A

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

126-150 of 207

Sort:
Network Analysis - Advanced Measurements and Modeling of Differential Devices

Application Note 2006-01-06

Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices

Application Note 2005-11-01

PNA - Amplifier - High-Power Testing (1408-10)

Application Note 2005-09-28

PNA - Analyze Lightwave Components (1408-14)

Application Note 2005-06-30

PDF PDF 471 KB
Validating Transceiver FPGAs Using Advanced Calibration Techniques

Application Note 2005-04-27

Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems

Application Note 2005-04-05

PDF PDF 1.37 MB
PNA - Antenna/RCS - Reduce Measurement Test Times
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.

Application Note 2004-12-20

Correlation of Simulation vs. Measurement in Frequency and Time Domain
For multi-gigahertz serial data link.

Application Note 2004-12-10

PDF PDF 1.24 MB
PNA - Antenna and RCS Measurement Advancements

Application Note 2004-12-01

PNA Calibration - Cable Length and VNA System Performance

Application Note 2004-11-24

PNA Automation - Software Application Development (1408-13)

Application Note 2004-09-13

How to configure HP Basic to communicate with the Agilent ENA analyzer via SCPI-LAN

Application Note 2004-08-06

PDF PDF 60 KB
Side-by-Side Comparison of Agilent and Tektronix Probing Measurements
When you make signal-integrity measurements on high-speed signals, the oscilloscope and probe you use can have a big impact on the accuracy of your measurements. Compare different manufacturers to find the best ones for your application.

Application Note 2004-06-17

Network Analysis - De-embedding and Embedding S-Parameter Networks (1364-1)
At RF and microwave frequencies, it becomes difficult to directly measure devices with nonstandard connectors (for example, devices using surface-mount packaging).

Application Note 2004-06-01

ENA/PNA Calibration - User Characterization: Electronic Calibration
ECal modules offer calibrations in a fraction of the time it would take to calibrate using mechanical calibrations, and are not just limited to quick accurate calibrations.

Application Note 2004-05-27

PNA - Pulsed Measurement Accuracy (1408-11)

Application Note 2004-02-17

On-wafer Balanced Component Measurement using the ENA RF Network Analyzer with the Cascade Microtech
This product note discusses how to perform full 4-port error correction using the ENA Series with Cascade Microtech's dual-tip Air Coplanar Probe (ACP).

Application Note 2004-02-09

Mixer Conversion-Loss and Group-Delay Meas. Techniques and Comparisons (1408-02) – Application Note
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.

Application Note 2004-01-28

PNA - Antenna - Pulsed Measurements
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Application Note 2004-01-06

PNA - Mixers - Absolute Group Delay of Multistage Converters
This paper describes new calibration and measurement techniques for measuring absolute group delay of frequency converters with multiple mixing stages

Application Note 2003-11-24

Method for Vector mixer Characterization and Mixer Test System Vector Error Correction – White Paper
A method for characterizing RF mixers, yielding magnitude and phase response for input match, output match,conversion loss, and mixers which have reciprocal conversion loss and for which the image response can be filtered out.

Application Note 2003-11-11

In-Fixture Characterization Using the ENA Series RF Network Analyzer with Cascade Microtech...
This product note explains a new approach for in-fixture characterization, using the Agilent ENA Series RF network analyzer with Cascade Microtech's probing system.

Application Note 2003-10-13

Improve the Circuit Evaluation Efficiency of Wireless LAN Chip Set Design (AN 1463-2)
This application note introduces circuit and component characteristics for the WLAN chipset design process using the ENA Series network analyzers. The topics highlighted are balanced measurements, fixture characterizations, and impedance matching.

Application Note 2003-08-14

PDF PDF 133 KB
High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Agilent E5270A and ENA series RF Network Analyzer.

Application Note 2003-08-10

Electronic vs. Mechanical Calibration Kits: Calibration methods and Accuracy – White Paper
The purpose of this paper is to clarify the differences between electronic and mechanical calibrations and how these differences affect measurement accuracy.

Application Note 2003-06-09

Previous 1 2 3 4 5 6 7 8 9 Next