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EDN's 19th Annual Innovation Awards Finalists: Agilent's PNA-X NVNA

Article 2012-11-30

The New Techniques Simplify Military Frequency-Converter Characterization - Article Reprint
This article is about a new technique that simplifies and reduces the cost of the measurement test set up.

Article 2012-11-01

PDF PDF 2.44 MB
Carrying Microwave Precision Into the Field - Article Reprint
Microwave Journal, September 2012 FieldFox product feature.

Article 2012-10-22

PDF PDF 1.83 MB
Testing Interference in a Wireless Environment - Article Reprint
Identification and reduction of interference has become essential to the proper operation in all wireless systems.

Article 2012-10-22

PDF PDF 202 KB
Impedance Measurement With E5061B LF-RF Network Analyzer Slides
This presentation material describes fundamentals, calibrations, and application examples of the impedance measurement using the E5061B-3L5 LF-RF network analyzer.

Article 2012-04-22

PDF PDF 5.38 MB
Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine

Article 2011-05-02

EE Times: Time-domain simulations of high-speed links with X parameters

Article 2011-03-29

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-30

Microwave Engineering Europe X-parameters Article

Article 2010-06-02

Identifying and Solving GSM 850 Interferences with Public Safety Communications
Identifying, solving GSM 805 interferences with public safety communications. Learn how Agilent and Bryant Solutions solved interference issues between a wireless operator and public safety agencies.

Case Study 2010-05-10

PDF PDF 809 KB
Microwave Journal Cover Article: X-parameters Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for x-parameters to model the behavior of non-linear devices. This is an article reprint from Microwave Journal, Issue March 2010, Vol.53. No.3

Article 2010-03-25

PDF PDF 771 KB
Tester overcomes RF problems with wireless network deployment and maintenance
Article reprinted with permission from AGL.

Article 2009-12-24

PDF PDF 2.33 MB
X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters

Article 2009-10-09

PDF PDF 1.92 GB
Microwaves and RF Cover Article: Nonlinear VNAs Extend to 50 GHz

Article 2009-07-23

Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed

Article 2009-01-01

New measurement option expands Agilent’s leadership in noise figure analysis
There are many choices today for performing noise figure measurements of LNAs and transistors. The new PNA-X source-corrected method offers a technique that provides the most accurate noise figure measurements available today.

Article 2007-11-01

PDF PDF 1.05 MB
Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis

Article 2007-07-26

PDF PDF 624 KB
The Evolution of RF/Microwave Network Analyzers

Article 2007-03-28

PDF PDF 969 KB
Efficere Technologies Develops World Class Test Fixtures
Read about Efficere’s design success using Agilent’s PLTS software, E8364B PNA and N1930A test set

Case Study 2006-11-29

PDF PDF 297 KB