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Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

Application Note 2011-11-29

PDF PDF 1016 KB
How Offset, Dynamic Range and Compression Affect Measurements - Application Note
This application note will clearly present how signal offset and oscilloscope/probe offset interact with regards to the dynamic range of the probe amps.

Application Note 2011-11-02

PDF PDF 1.97 MB
Eight Hints for Better Scope Probing
Probing is critical to making quality oscilloscope measurements, and often the probe is the fi rst link in the oscilloscope measurement chain.

Application Note 2011-05-24

Specifying Calibration Standards and Kits for Agilent Vector Network Analyzers (AN 1287-11)
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Agilent's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

Measuring Frequency Response with E5061B LF Network Analyzer
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2010-04-28

Improved Throughput in Network Analyzer Applications (AN 1287-5)
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Application Note 2010-03-15

High frequency probing solutions for time and frequency domain
This application note discusses high-frequency probing using U1818A/B active differential probes with a network, spectrum, and signal source analyzer.

Application Note 2009-09-23

Extending the Range of Agilent InfiniiMax Probes
This application note describes how to extend the operating range of Agilent InfiniiMax probes in voltage, temperature, and distance (reach between probe amplifiers and heads

Application Note 2009-06-26

Comprehensive Multiport Solution for the ENA Network Analyzer
This application note discusses the benefits of using a comprehensive multiport solution such as the E5071C ENA network analyzer with the E5092A configurable multiport test set.

Application Note 2008-10-29

Measurement Wizard Assistant software for ENA
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

Application Note 2008-09-30

Oscilloscope probing for high-speed signals
The probe is the dominant factor in determining the noise floor and response of your measurement system. Probe loading effects on the circuit under test are also a critical consideration.

Application Note 2008-09-03

InfiniiMax Probes Impact on Lead-Free (ROHS) Compliance
Some Agilent InfiniiMax oscilloscope probe heads are intended for soldering to the device under test.

Application Note 2008-06-20

PDF PDF 221 KB
The Truth About The Fidelity of High Bandwidth Voltage Probes, AN 1404
An analysis of high-bandwidth voltage probes that reveals a fundamental tradeoff between fidelity and ease of use that exists with all high-bandwidth probes.

Application Note 2008-06-20

Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.

Application Note 2008-03-10

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Upgrade Guide for the Agilent 8510
This 20 page Product Note describes how the 8510 systems can be upgraded from any combination of the following to another: Agilent 8510XF, 85106D, and 85107B.

Application Note 2006-07-13

PDF PDF 290 KB
8510 Calibration Standard Definitions (AN 8510-5B)
This Product Note covers methods for specifying calibration standards and describes the procedures for their use with the Agilent 8510 Network Analyzer.

Application Note 2006-07-13

PDF PDF 1.12 MB
8510 Calibration - Measuring Noninsertable Devices (PN 8510-13)
The majority of devices used in real-world microwave systems are noninsertable because of the connectors employed.

Application Note 2006-07-13

PDF PDF 261 KB
Network Analysis - Advanced Measurements and Modeling of Differential Devices

Application Note 2006-01-06

Side-by-Side Comparison of Agilent and Tektronix Probing Measurements
When you make signal-integrity measurements on high-speed signals, the oscilloscope and probe you use can have a big impact on the accuracy of your measurements. Compare different manufacturers to find the best ones for your application.

Application Note 2004-06-17

ENA/PNA Calibration - User Characterization: Electronic Calibration
ECal modules offer calibrations in a fraction of the time it would take to calibrate using mechanical calibrations, and are not just limited to quick accurate calibrations.

Application Note 2004-05-27

PNA - Antenna - Pulsed Measurements
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Application Note 2004-01-06

ENA/PNA - Mixers - Vector Error Correction
A method for characterizing RF mixers, yielding magnitude and phase response for input match, output match,conversion loss, and mixers which have reciprocal conversion loss and for which the image response can be filtered out.

Application Note 2003-11-11

Network Analysis - Calibration - Electronic vs. Mechanical Cal Kits
The purpose of this paper is to clarify the differences between electronic and mechanical calibrations and how these differences affect measurement accuracy.

Application Note 2003-06-09

Understanding and Using Offset in InfiniiMax Active Probes (AN 1451)
This application note explains how offset is applied in the Agilent InfiniiMax Active Probes and how to use offset for various applications.

Application Note 2003-03-31

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