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PDF
1.91 MB
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10GbE Technology and Device Characterization with the 81250 ParBERT
A wide range of measurements are described in the 802.3ae Standard, including optical transmitter and receiver testing, electrical XAUI test are essentially eye mask measurements.
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2003-04-22
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Application Note
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PDF
1.02 MB
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81250 ParBERT System Setup Examples
This is a collection of examples on how to use the Agilent 81250 Parallel Bit Error Ratio Tester for various applications.
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2002-12-12
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Application Note
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PDF
812 KB
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Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specification
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2005-09-22
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Application Note
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PDF
1.98 MB
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Agilent Method of Implementation (MOI) for DisplayPort
Agilent Method of Implementation (MOI) for DisplayPort Sink Compliance Tests
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2007-11-03
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Application Note
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PDF
2.92 MB
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De-Emphasized Signal Generation with the 81250A ParBERT - Application Note
This application note covers the basics of de-emphasized signal generation while considering the possible application and testing situations best suited for the 81250A ParBERT.
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2009-01-15
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Application Note
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PDF
2.67 MB
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Fast Total Jitter Test Solution
Compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement
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2005-05-19
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Application Note
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PDF
1.69 MB
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Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.
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2003-06-30
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Application Note
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PDF
431 KB
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HDMI Sink and Source Compliance Test and Characterization
In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.
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2006-10-27
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Application Note
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PDF
611 KB
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How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
How to characterize the Physical Layer of the Mobile Industry Processor Interface (MIPI D-PHY)
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2007-07-30
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Application Note
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PDF
4 MB
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Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.
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2003-02-03
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Application Note
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PDF
3.18 MB
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Jitter Fundamentals: Jitter Tolerance Testing with Agilent ParBERT 81250
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.
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2003-12-02
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Application Note
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PDF
1.91 MB
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Measuring Jitter in Digital Systems (AN 1448-1)
Measuring jitter and how to calculate total jitter.
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2008-01-30
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Application Note
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PDF
1.86 MB
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Method of Implementation (MOI) for DisplayPort Sink Compliance Test
Method of Implementation (MOI) for DisplayPort Sink Compliance Test
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2008-08-18
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Application Note
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PDF
2 MB
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Next Generation I/O Bus PCI Express BER Test Solution
PCI Express increases data transport efficiency and data quality. It uses an 8b/10b encoding methodology to embed the clock signal ...
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2005-05-25
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Application Note
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PDF
222 KB
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Total Jitter Measurement at Low Probability Levels
White paper produced for DesignCon 2005 regarding Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method.
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2005-07-11
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Application Note
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PDF
348 KB
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Upgrade to PCI Express 2.0© Receiver Test
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.
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2008-10-24
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Application Note
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