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Test-System Development Guide: A Comprehensive Handbook for Test Engineers
Test-System Development Guide

Application Note 2012-05-07

PDF PDF 5.04 MB
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Using .NET Methods to Add Functionality to IVI-COM Drivers
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

Application Note 2012-03-01

PDF PDF 335 KB
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LXI Brochure
The Agilent LXI Brochure shows you how to open the door to simpler system creation.

Brochure 2011-06-16

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
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The Next Generation of Test: An LXI Overview

Promotional Materials 2007-11-13

PDF PDF 1.89 MB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

PDF PDF 200 KB
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Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

PDF PDF 234 KB
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

PDF PDF 175 KB
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Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Application Note 2006-05-03

PDF PDF 190 KB
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Defining three classes of LAN eXtensions for Instrumentation (LXI)
The LXI standard defines three types of instruments that can be readily mixed and matched within a test system.

Application Note 2006-01-12

Replacing the Agilent 34401A with the New 34410A/34411A High Performance Digital Multimeters
This application note provides a high level overview of the differences between the Agilent 34401A 6 1/2 Digit Digital Multimeter and the new Agilent 34410A and 34411A 6 1/2 Digit High Performance DMMs.

Application Note 2005-11-15

PDF PDF 298 KB
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A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

PDF PDF 241 KB
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Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB