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Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

Notes d’application 2012-10-30

PDF PDF 1.11 MB
8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Notes d’application 2009-09-07

PDF PDF 739 KB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.

Notes d’application 2009-06-17

PDF PDF 2.02 MB
Langues 
Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Notes d’application 2008-12-10

PDF PDF 283 KB
Langues 
Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

Notes d’application 2008-11-21

PDF PDF 321 KB
Langues 
Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...

Notes d’application 2008-11-20

PDF PDF 263 KB
Langues 
New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

Notes d’application 2008-11-20

PDF PDF 331 KB
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Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

Notes d’application 2008-11-13

PDF PDF 461 KB
Langues 
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.

Notes d’application 2008-10-28

PDF PDF 1.65 MB
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Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

Notes d’application 2008-04-10

PDF PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Notes d’application 2008-04-03

PDF PDF 119 KB
Characterizing MEMS Magneto-Impedance Sensor using the Agilent Impedance Analyzer
This application brief describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.

Notes d’application 2007-03-31

PDF PDF 235 KB
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Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

Notes d’application 2006-06-26

PDF PDF 168 KB
Langues 
Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Agilent 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Notes d’application 2003-06-26

PDF PDF 1.01 MB
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Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Notes d’application 2001-12-19

PDF PDF 666 KB
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Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.

Notes d’application 2001-11-05

PDF PDF 945 KB
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High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Agilent 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.

Notes d’application 2001-10-25

PDF PDF 471 KB
Langues 
Reliable Electronic Component Evaluation and Circuit Design with the 4294A(PN4294-1)

Notes d’application 2001-08-31

PDF PDF 406 KB
Langues 
Combining Network and Spectrum Analyses and IBASIC (AN 1288-1)
Active components (and now even some passive components like crystal filters require analysis to characterize linear parameters (gain/loss, phase and group delay or S-parameters) as well as non-linear performance. Non-linear analysis is typically related to measuring signal distortion generated...

Notes d’application 2001-08-30

PDF PDF 352 KB
Langues 
Accurate Impedance Measurement with Cascade Microtech Probe System(AN1369-3)
This 12 page application note explains how to make on-wafer or on-substrate 1-port impedance measurements using a probe station.The E4991A (1 M-3 GHz) and 4294A (40-110 MHz) solutions are discussed.

Notes d’application 2001-07-31

PDF PDF 2.25 MB
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Advanced impedance measurement capability of the RF I-V method (AN 1369-2)
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Notes d’application 2001-07-26

PDF PDF 753 KB
Langues 
New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Notes d’application 2001-05-24

PDF PDF 1.35 MB
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Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.

Notes d’application 2001-04-16

PDF PDF 2.21 MB
Electronic Characterization of Impedance Analyzer (AN 1300-5)
This application note describes in broad terms how to use the 4291B RF Impedance/Material Analyzer in determining the impedance characteristics of IC packages up to 1.8 GHz. This information is useful for high speed digital designers, component...

Notes d’application 2000-11-01

PDF PDF 512 KB
How to Measure Noise Accurately Using the Agilent Combination Analyzers (PN 4395/96-1)
Product note comparing Agilent combination analyzers (4395A, 4396B) and conventional Agilent spectrum analyzers (4195A, 3588A, 3585A/B). Agilent no longers sells these products.

Notes d’application 2000-11-01

PDF PDF 121 KB
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