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E4990A Impedance Analyzer Migration Guide from 4294A
This migration guide describes the difference between the E4990A and 4294A impedance analyzers.

应用说明 2014-06-15

PDF PDF 40 KB
Network Analyzer Application Note List and Application Matrix
This provides the list of application notes related with solution and application.

应用说明 2013-12-31

XLS XLS 31 KB
Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

应用说明 2013-09-27

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

应用说明 2013-09-10

E4982A LCR Meter 1 MHz to 3 GHz Migration Guide from 4287A Application Note
This migration guide describes the difference between the Agilent E4982A LCR Meter and 4287A RF LCR Meter.

应用说明 2012-11-21

PDF PDF 1.42 MB
Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Agilent impedance analyzers, LCR meters and ENA series network analyzers.

应用说明 2012-10-30

PDF PDF 1.11 MB
使用网络和阻抗分析仪评测13.56 MHz RFID 标签和阅读器/记录器
本应用指南面向从事 RFID 天线设计和测试的工程师,探讨了如何使用网络分析仪和阻抗分析仪测试 RFID 天线特征,例如阻抗和谐振频率。

应用说明 2012-06-08

Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4)
The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument.

应用说明 2012-04-27

PDF PDF 51 KB
安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
安捷伦成功测量阻抗的 8 点提示 应用指南 346-4。测量阻抗有几种不同的技术和方法,应该根据测量的频率范围、要测量的阻抗参数以及想要显示的测量结果来选择一个具体的测试技术。

应用说明 2011-12-31

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

应用说明 2011-11-29

PDF PDF 1016 KB
安捷伦高效变压器/低频线圈测试 应用指南 1305-3
安捷伦高效变压器/低频线圈测试 应用指南 1305-3

应用说明 2011-02-01

MEMS/NEMS Device Measurement Solution
Agilent helps you characterize MEMS/NEMS device.

应用说明 2010-09-19

使用E5061B低频 - 射频网络分析仪,测量直流 - 直流变换器和PDN器件应用指南
使用E5061B低频 - 射频网络分析仪 测量直流 - 直流变换器和PDN器件应用指南。开关式DC-DC变换器 /电压调节器是广泛应用于各行业电子设备中的器件。近年来,高性能计算机设备推动了 DC-DC 变换器技术迅速向前发展。

应用说明 2010-09-01

使用 Agilent E5061B 低频- 射频网络分析仪测量频率响应
使用 Agilent E5061B 低频- 射频网络分析仪测量频率响应。包含选件 3L5 的 E5061B 矢量网络分析仪具有很宽的频率测量范围,从 5 Hz 至 3 GHz。E5061B-3L5 包括 S 参数测试端口(5 Hz 至 3 GHz,Zin= 50 Ω)和增益相位测试端口(5 Hz 至 30 MHz,Zin = 1 MΩ/50 Ω)。两种测试端口都可以用于低频器件的测试(取决于测量需求)。表 1 举例说明了怎样选择使用这两种测试端口。

应用说明 2010-08-01

Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

应用说明 2009-10-28

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

应用说明 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

应用说明 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

应用说明 2008-11-20

Measurement of Capacitance Characteristics of Liquid Crystal Cell (AN 369-7)
This application note describes how to take best advantage of the 4284A's powerful features when measurin gcapacitance while varying an AC signal voltage applied tothe liquid crystal material under test.

应用说明 2008-11-20

Achieving Fast Design Cycle Time
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.

应用说明 2008-11-13

MEMS On-wafer Evaluation in Mass Production
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

应用说明 2008-11-12

Total Analysis Environment for Modeling
Agilent IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

应用说明 2008-08-21

High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.

应用说明 2008-08-21

Dielectric Constant Evaluation of Rough Surfaced Materials (PN 4291-5)
This product note describes the technologies and features in the 4291B RF Impedance/Material Analyzer to extend accurate impedance measurements to 1.8 GHz. Advantage of the new V-I impedance technique for direct impedance measurement, cable...

应用说明 2008-06-02

PDF PDF 111 KB
ADSL Copper Loop Measurements (PN 4395-1)
This product note provides a practical guidance for the copper loop measurement for ADSL by using the 4395A.

应用说明 2008-04-15

PDF PDF 123 KB

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