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8.83 MB
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Agilent LCR 錶，阻抗分析儀與測試夾具選購指南
Agilent LCR 錶，阻抗分析儀與測試夾具選購指南
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2002-12-24
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MEMS/NEMS 裝置量測解決方案
安捷倫可協助您進行 MEMS/NEMS 裝置的特性分析。
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2008-06-04
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1.63 MB
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成功的阻抗量測之8大祕訣A/N:346-4
成功的阻抗量測之8大祕訣A/N:346-4
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2002-12-23
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516 KB
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16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures
This Product Note explains that the ability to verify the correlation of impedance measurement results is dependent on the variety of factors.
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2007-03-06
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599 KB
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8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.
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2000-06-01
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461 KB
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Achieving Fast Design Cycle Time Using an Electronic Design Automation (EDA) Tool and Impedance Anal
This application note describes how fast cycle time is achieved using the impedance analyzer such as the E4991A and 4294A with the Electronic Design Automation (EDA) tools.
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2008-11-13
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116 KB
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Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.
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2008-04-10
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202 KB
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Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.
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2007-04-04
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121 KB
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Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Agilent E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.
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2007-04-04
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119 KB
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Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.
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2008-04-03
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217 KB
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Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4)
The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument.
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1998-10-01
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414 KB
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Dielectric Constant Measurement of Solid Materials (AN 380-1)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1989-10-01
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386 KB
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Effective Electrolytic Capacitors Testing (AN 1305-4)
With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of...
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2000-11-01
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302 KB
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Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction
This application note describes how to make an accurate impedance measurement by using OPEN/SHORT/LOAD correction.
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1998-06-01
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945 KB
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Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.
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2001-11-05
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263 KB
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Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...
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2008-11-20
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378 KB
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Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.
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2000-11-01
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2.2 MB
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Fundamentals of RF and Microwave Power Measurements (AN 64-1C)
This Application Note is for information only. Agilent no longer sells or supports these products.
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2001-04-16
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471 KB
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High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Agilent 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.
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2001-10-25
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396 KB
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High Speed Modeling System with IC-CAP
Agilent has new modeling system configurations that meet the needs of advanced semiconductor processes.
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2008-08-21
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2.02 MB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
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2009-06-17
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171 KB
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Impedance Measurements of Magnetic Heads Using Constant Current (AN 369-3)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1988-07-01
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663 KB
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Impedance Testing using Scanner (AN 369-6)
This Application Note is for information only. Agilent no longer sells or supports these products.
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1988-09-01
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168 KB
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Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.
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2006-06-26
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206 KB
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Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.
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2007-04-12
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