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Measuring Dielectric Properties using Agilent's Materials Measurement Solutions - Brochure
Quick guide for Agilent materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.
手册 2013-04-05 |
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478 KB
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Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.
应用说明 2013-04-03 |
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3.60 MB
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85071E Web Help
Instantly view the very latest information in the Materials Measurement software’s help file.
帮助文件 2012-06-27 |
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85070E Web Help
Instantly view the very latest information in the Dielectric Probe Kit software’s help file.
帮助文件 2012-06-27 |
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85070E Dielectric Probe Kit, 200 MHz to 50 GHz - Technical Overview
Agilent's 85070E is a dielectric probe kit that is used to measure the intrinsic electrical properties of materials in the RF and microwave frequency bands. The 85070E software allows you to measure the complex dielectric constant of liquids and semisolids, including the dielectric loss factor or loss tangent. This 12-page, black and white technical overview contains product description, features/benefits, performance characteristics, menu items, and ordering information.
技术总览 2012-06-14 |
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1.69 MB
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LCR 表、阻抗分析仪和测试夹具
LCR 表、阻抗分析仪和测试夹具
选型指南 2012-06-01 |
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85072A 10-GHz Split Cylinder Resonator
This technical overview provides an overview of features, measuring examples, and specification of the 85072A 10 GHz split cylinder resonator.
技术总览 2012-05-08 |
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989 KB
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85072A 10 GHz Split-Cylinder Resonator User’s and Service Guide
Provides information on making measurements, specifications, maintenance & troubleshooting, replaceable parts, and replacement procedures for the 85072A.
用户手册 2012-05-01 |
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1.65 MB
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用于对基板进行介电测量的安捷伦分离式介电谐振器
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.
应用说明 2012-01-31 |
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安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
安捷伦成功测量阻抗的 8 点提示 应用指南 346-4
应用说明 2011-12-31 |
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Declaration of Conformity
Search Agilent Regulatory database for most recent Declaration of Conformity statement for your product.
帮助文件 2010-10-15 |
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35670A Service Guide
Manual publication number 35670-90066.
服务手册 2010-03-01 |
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11.84 MB
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GPIB Programming with the Agilent 35670A
This manual contains the command syntax, structure and a detailed description of each GPIB command available for the Agilent 35670A. In addition, it contains instrument-specific information not available in the GPIB Programmer's Guide.
编程和语法指南 2010-03-01 |
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2.92 MB
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35670A Quick Start Guide
迅速开始指南 2010-03-01 |
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1.89 MB
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35670A Installation and Verification Guide
安装手册 2010-03-01 |
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3.56 MB
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35670A Operator's Guide
35670-90053. Contains chapters on making measurements, working with the display, using the basics, and much more.
用户手册 2010-03-01 |
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3.92 MB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
应用说明 2009-06-17 |
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35670A Dynamic Signal Analyzer Product Overview
The Agilent 35670A is a portable two- or four-channel dynamic signal analyzer with the versatility to be several instruments at once.
技术总览 2009-01-12 |
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1.47 MB
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35670A Dynamic Signal Analyzer Data Sheet
Technical specifications for the 35670 Dynamic Signal Analyzer.
产品资料 2009-01-09 |
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131 KB
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Installation Guide, 85070/1E Dielectric Probe Kit and Materials Measurement Software
Provides instructions for installing and configuring the 85070E and 85071E software products.
安装手册 2009-01-01 |
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288 KB
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Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers (AN 1369-1)
This presents the technologies and methods for measuring permittivity and permeability. Primarily on methods that employ the impedance measurement technology.
应用说明 2008-10-28 |
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1.65 MB
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天线测试选型指南
选型指南 2008-10-22 |
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N5264A PNA-X 测量接收机传单
照片卡
促销资料 2008-10-17 |
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308 KB
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用于电阻测量的附件选购指南
可与LCR表、电阻表、电容表、电阻分析仪和组合分析仪结合使用的电阻测试夹具
选型指南 2007-12-13 |
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A Refresher Course on Windowing and Measurements
In these days of digital instrumentation and PCs, it is easy to forget that physical phenomena are analog and that windows are not always operating systems. Windowing and digitization meet in the process of dynamic signal analysis. This Realtime Update article, Fall 1995 - Winter 1996, Hewlett...
文章 2007-02-22 |
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90 KB
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