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Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2014-05-16

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2013-09-27

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Agilent Technologies's most detailed information on the basics of impedance measurements using Agilent Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

Split Post Dielectric Resonators for Dielectric Measurements of Substrates
The split post dielectric resonator (SPDR) provides an accurate technique for measuring the complex permittivity of dielectric and ferrite substrates and thin films at a single frequency point in the frequency range of 1 to 20 GHz.

Application Note 2006-07-19

Is Phase Missing from your Diagnostic Toolbox?
We all know that dynamic signal analyzers provide some great frequency-domain tools for diagnosing rotating machinery problems. However, in a rush to FFT ourselves into the frequency domain, it s too easy to overlook a powerful time-domain tool. Phase can be a real lifesaver when you re trying...

Application Note 2004-02-20

Using Psycho-acoustic Analysis to Characterize Product Noise
In this White Paper by Josef Hobelsberger of Mueller BBM and Al Prosuk of m+p international, it's been said that the 20th century is not simply the age of industry, but the age of noise. No matter where we work, where we live, or what we do, noise surrounds us. Increasingly, product manufacturers...

Application Note 2004-02-20

Better, Safer Power Generation Measurements in Less Time
Attached is a White Paper by John Demcko of Arizona Public Service and John Jensen of Hewlett-Packard, first published in Realtime Update, Fall 1995 - Winter 1996, Hewlett-Packard, that discusses safer power generation measurements in less time. If you're trying to boost efficiency in an electric...

Application Note 2004-02-20

Working with Model 35670A Data Formats
The 35670A Dynamic Signal Analyzer is designed to be used primarily as a stand-alone instrument with the measurement results plotted on its display.

Application Note 2003-06-19

Migration Information for the 3852A Data Acquisition/Control Unit
The 3852A Data Acquisition/Control Unit has been a highly popular product since it's introduction in 1985.

Application Note 2003-02-19

Fundamentals of Signal Analysis Series (AN 1405-2)
This application note is a primerfor those who are unfamiliar with the class of analyzers we call dynamic signal analyzers. These instruments are particularly appropriate for the analysis of signals in the range of a few millihertz to about a hundred kilohertz.

Application Note 2002-08-06

Fundamentals of Signal Analysis Series (AN 1405-1)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains.

Application Note 2002-05-24

Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Application Note 2001-05-24

Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.

Application Note 2000-11-01

Precision Time-Domain Measurement Using the Agilent E1430A (PN E1430A-1)
This Product Note presents some key considerations in using the Agilent E1430A for acquisition of signals to be analyzed or displayed in the time domain.

Application Note 2000-08-01

8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

Fundamentals of Signal Analysis (AN 243)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...

Application Note 2000-06-01

Bearing Runout Measurements (AN 243-7)
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

Application Note 2000-05-01

10-Megasample-per-Second Analog-to-Digital Converter with Filter and Memory: Agilent (PN E1430A)
This Product Note is a reprint of the October 1993 Hewlett-Packard Journal article on the Agilent E1430A.

Application Note 2000-05-01

Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

Control System Development Using Dynamic Signal Analyzers (AN 243-2)
This Application Note provides a review of the basic concepts of control systems, an introduction to the features and functions of DSAs that apply to control systems design and testing, and a glossary of control system terms. The Note discusses the key concepts engineers need to measure in...

Application Note 1998-03-01

Effective Machinery Measurements Using Dynamic Signal Analyzers (AN 243-1)
This Application Note outlines the benefits of vibration analysis and provides basic information on making machinery measurements. It explains how vibration is converted to electrical signals and how the frequency domain helps users identify the comp. of signal. It also identifies the vibration...

Application Note 1997-12-01

Vehicle Body Testing (AN 1270-5)
Application Note 1270-5 describes how an HP System submits a vehicle to a variey of test track stress conditions and measures the resulting performance on material fatigue and stress.

Application Note 1995-06-01

On-Road Vehicle Testing (AN 1270-6)
In Application Note 1270-6 on-road prototype vehicle performance characterization is accomplished by the use of a 13 slot VXI Data Acquisition System and computerized real time data analysis.

Application Note 1995-06-01

Prototype Jet Engine Characterization (AN 1270-3)
In Application Note 1270-3 a 13 slot VXI Data Acquisition System is used during the testing of jet engine prototypes to log data on a multitude of performance parameters to refine design characteristics.

Application Note 1995-06-01


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