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Dynamic Signal Analyzers, Materials Measurement

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35670A Operator's Guide Supplement
Supplemental Operator's Guide.

User Manual 2002-03-14

Using Instrument Basic with the 35670A
This manual will help you learn about using your Instrument BASIC software on the Agilent 35670A.

User Manual 2002-03-14

Network, Spectrum, and Impedance Evaluation of Electronic Circuits and Components (AN 1308-1)
This Application Note describes how the Agilent 4395A/96B can be used to contribute fast cycle time for electronic circuit/component development.

Application Note 2001-12-19

85071B Materials Measurement Software User's Manual (Apr93)
85071B Materials Measurement Software User's Manual

User Manual 2001-11-29

16453A Dielectric Material Test Fixture Specification and Service Manual
16453A Dielectric Material Test Fixture Specification and Service Manual

User Manual 2001-11-15

16452A Liquid Test Fixture Operation and Service Manual
16452A Liquid Test Fixture Operation and Service Manual

User Manual 2001-11-15

8530A/85370A (8530A Option 005/H58) Operating Note (May01)
8530A/85370A (8530A Option 005/H58) Operating Note

User Manual 2001-10-29

Hammer-3D and Shaker-3D Software from Seattle Sound and Vibration, inc.
Commercial 35670A I-basic software available from Seattle Sound and Vibration, inc. Hammer 3D allows 35670A users to perform modal analysis with FRF data collected with the 35670A using impact hammer measurement techniques. Curve Fitting and full 3D animation are included in this product.

Reference Guide 2001-09-05

16008B Data Sheet
Technical specifications for the 16008B Resistivity Cell

Data Sheet 2001-08-01

PDF PDF 47 KB
16454A Magnetic Material Test Fixture Operation and Service Manual
This manual describes basic information needed to use the 16454A. It provides a general information, specifications, operation, and service information.

User Manual 2001-07-01

PDF PDF 1.43 MB
New Generation Analyzer Offers Exceptional and Powerful Analysis Functions for RF...(PN E4991A-1)
This Product Note describes the key technology of RF impedance measurement, today's RF component evaluation methodologies and advanced features of the E4991A product.

Application Note 2001-05-24

35665A Data Sheet

Data Sheet 2001-04-12

PDF PDF 28 KB
Automated Data Acquisition and Analysis at the Benefield Anechoic Facility
Automated data acquisition and analysis methods at the Benefield Anechoic Facility have improved the test process.

Case Study 2001-04-05

Evaluating Temperature Characteristics using a Temperature Chamber and the Agilent 4291B (PN 4291-2)
This note introduces an efficient and highly reliable method for evaluating temperature characteristics using a combination of the 4291B RF Impedance/Material Analyzer and a Tabai Espec temperature chamber.

Application Note 2000-11-01

16451B DIELECTRIC TEST FIXTURE Operation and Service Manual
This manual describes basic information needed to use the 16451B. It provides a installation, general information, specifications, supplemental performance characteristics, operation, and service information.

User Manual 2000-10-01

PDF PDF 1.67 MB
Precision Time-Domain Measurement Using the Agilent E1430A (PN E1430A-1)
This Product Note presents some key considerations in using the Agilent E1430A for acquisition of signals to be analyzed or displayed in the time domain.

Application Note 2000-08-01

PDF PDF 166 KB
8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

Fundamentals of Signal Analysis (AN 243)
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...

Application Note 2000-06-01

Bearing Runout Measurements (AN 243-7)
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

Application Note 2000-05-01

3587 Product Overview

Data Sheet 2000-05-01

PDF PDF 1.59 MB
3587 Data Sheet, 262 kB

Data Sheet 2000-05-01

PDF PDF 256 KB
10-Megasample-per-Second Analog-to-Digital Converter with Filter and Memory: Agilent (PN E1430A)
This Product Note is a reprint of the October 1993 Hewlett-Packard Journal article on the Agilent E1430A.

Application Note 2000-05-01

PDF PDF 158 KB
Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

16008B Resistivity Cell Operation and Service Manual
This manual describes basic information needed to use the 16008B. It provides a function overview, specifications, operation procedure, and service information.

User Manual 2000-03-01

PDF PDF 1013 KB
Control System Development Using Dynamic Signal Analyzers (AN 243-2)
This Application Note provides a review of the basic concepts of control systems, an introduction to the features and functions of DSAs that apply to control systems design and testing, and a glossary of control system terms. The Note discusses the key concepts engineers need to measure in...

Application Note 1998-03-01

PDF PDF 420 KB

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