Support technique: Test y Medida

Signal Studio for 1xEV-DO E4438C-404 Technical Overview A 4-page overview of the main features, benefits, and ordering information for E4438C Option 404. Technical Overview 2007-06-12	PDF 203 KB
How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns. Application Note 2005-08-15	PDF 90 KB Languages English \| 2005-08-15 \| PDF 90 KB 日本語 \| 2007-01-29 \| PDF 276 KB 한국어 \| 2005-08-15 \| PDF 90 KB
E4438C Signal Studio for 1xEV-DO Application Note This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO. Application Note 2003-06-13	PDF 2.37 MB
E443xB Signal Studio for 1xEV-DO Application Note This application note is a self-guided tutorial describing the test signals that can be created with Signal Studio for 1xEV-DO. Application Note 2002-01-31	PDF 1.69 MB Languages English \| 2002-01-31 \| PDF 1.69 MB 日本語 \| 2002-05-29 \| PDF 1.99 MB
E443xB Signal Studio for 1xEV-DO Product Overview This 2-page product overview contains the main features, benefits, and ordering information for Option 404 for the E443xB. Application Note 2002-01-31	PDF 187 KB Languages English \| 2002-01-31 \| PDF 187 KB 日本語 \| 2002-05-29 \| PDF 403 KB

Technical Support