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Creating Arbitrary Waveforms in the U2300A Series and U2500A Series Data Acquisition Devices
This application note covers the inner workings of how waveforms and arbitrary waveforms are formed.

Application Note 2009-08-01

Selecting DC Sources for Telecommunications Equipment Test Systems Application Note
When selecting DC sources for test systems, one must take industry standards on DC power into consideration. The Agilent N5700 and N8700 series DC Sources offer a wide choice of power and voltage levels.

Application Note 2009-07-22

PDF PDF 204 KB
Power Sources for Energy-Efficient High Input Voltage Equipment Development Application Note
Telecommunications equipment developers face several challenges when selecting power sources for test systems for developing new telecommunications equipment for network installations employing high voltage power distribution.

Application Note 2009-07-22

PDF PDF 302 KB
Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

Testing Terrestrial Solar-Powered Inverters Using Solar Array Simulation Techniques
This application note describes how to test terrestrial solar-powered inverters using solar array simulation techniques.

Application Note 2009-06-01

Power Toolbox for Embedded System Designs
Properly Powering On and Off Multiple Power Inputs in Embedded Designs

Application Note 2009-06-01

Transferring Arbitrary Waveform Data to the 33200A Family of Function/Arbitrary Waveform Generators
This application note will review three methods of transferring arbitrary waveform data to 33200A Function/Arbitrary Waveform Generators: front panel, Agilent IntuiLink Waveform Editor, and programming.

Application Note 2009-05-19

AN B1500-13 Measuring Pulsed/Transient Electrical Properties of OTFTs
This 12-page application note describes how to measure pulsed / transient electrical property of OTFT without additional measurement instruments.

Application Note 2009-05-18

Using Two Power Supplies for Higher Current Solar Cell Characterizing
This application note describes the Agilent 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Application Note 2009-04-29

Test and Measurement Instrument Security
This document describes security features and the steps to perform a security erase for select Agilent test and measurement instruments.

Application Note 2009-04-14

PDF PDF 167 KB
TO B1500A Easy High Power Pulsed IV Measurement Using the Agilent B1500A’s HV-SPGU Module
This document describes the high power pulsed IV measurement using the B1525A high voltage semiconductor pulse generator unit for B1500A semiconductor device analyzer mainframe.

Application Note 2009-04-01

PDF PDF 370 KB
AN B1500-11 Characterizing Random Noise in CMOS Image Sensors
This application note describes how to characterize random noise in CMOS image sensor, and RTS noise measurement using the B1500A with the WGFMU module.

Application Note 2009-03-13

Generating I-V Curves with the Agilent E4360A Solar Array Simulator Using the Parameters Voc, Isc, N

Application Note 2009-03-12

Adding DC Offsets to a Function Generator's Output
A variety of electronic test applications require a DC offset to be added to the output of a function generator.

Application Note 2009-03-09

PDF PDF 383 KB
AN B1500-12 1 micro second IV Characterization of Flash Memory Cells Using the Agilent B1530A
This application note describes how the B1530A WGFMU can be used to solve the measurement challenges faced when performing high speed IV characterization of flash memory cells.

Application Note 2009-03-05

De-Emphasized Signal Generation with the 81250A ParBERT - Application Note
This application note covers the basics of de-emphasized signal generation while considering the possible application and testing situations best suited for the 81250A ParBERT.

Application Note 2009-01-15

PDF PDF 2.93 MB
Improved Methods for Measuring Distortion in Broadband Devices
This paper illustrates that, in broadband commercial and defense systems, it is more important than ever to characterize them for non-linearity.

Application Note 2008-12-10

PDF PDF 620 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse - Application Note
Receiver Testing With J-BERT N4903A and 81150A Pulse

Application Note 2008-12-03

PDF PDF 1000 KB
Using IVI For Your Instrument Driver - Application Note
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Waveform capture, modification and playback using a function generator
Function generators are used to simulate real-world signals on a device.

Application Note 2008-10-30

Using Pulse-Width Modulation to Control Signals
The use of pulse-width modulation (PWM) has become an increasingly popular technique for controlling analog circuits with a digital signal.

Application Note 2008-10-30

Upgrade to PCI Express 2.0© Receiver Test - Application Note
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.

Application Note 2008-10-24

PDF PDF 348 KB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Sequential Shunt Regulation - Regulating Satellite Bus Voltages

Application Note 2008-10-08

Side-by-Side Comparison: E435xB Solar Array Simulator and E436xA Modular Solar Array Simulator

Application Note 2008-10-01

PDF PDF 514 KB

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