技術支援
移除所有細分1-25 / 405
|
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
應用手冊 2013-05-10 |
PDF
2.02 MB
|
|
GNSS Technologies and Receiver Testing - Application Note
This application note provides information on GNSS technologies including GPS, Compass, Beidou, Galileo, and Glonass, along with the related receiver test challenges and solutions.
應用手冊 2013-05-08 |
PDF
3.63 MB
|
|
Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.
應用手冊 2013-04-29 |
|
|
Overvoltage Protection in Power Supplies - Application Note
This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications
應用手冊 2013-04-18 |
PDF
832 KB
|
|
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.
應用手冊 2013-04-11 |
PDF
904 KB
|
|
PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note
This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis
應用手冊 2013-04-08 |
PDF
736 KB
|
|
Multichannel Measurements in MIMO 802.11ac Baseband IQ Simulation, Design and Test - Application Not
This solution brief will show Agilent Technologies' complete, end-to-end solution for multichannel measurements of 802.11ac BBIQ simulation, design and test.
應用手冊 2013-04-05 |
PDF
748 KB
|
|
Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.
應用手冊 2013-04-03 |
|
|
Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.
應用手冊 2013-04-01 |
PDF
476 KB
|
|
DVB-T and DVB-T2 Transmitter Test Challenges - Application Note
This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of transmitters for these systems.
應用手冊 2013-02-27 |
PDF
986 KB
|
|
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A
應用手冊 2013-02-14 |
PDF
793 KB
|
|
Testing DVB-T and DVB-T2 Receivers - Application Note
This application note presents a discussion of the DVB-T and DVB-T2 systems and the measurement challenges facing developers of receivers such as set-top-boxes.
應用手冊 2013-02-02 |
PDF
716 KB
|
|
Addressing the Challenges of Deploying Single Frequency Networks DVB-T & DVB-T2 - Application Note
This application addresses the challenges of deploying SFN systems for digital video broadcasting and describe's Agilent's solutions for meeting these challenges.
應用手冊 2013-01-17 |
PDF
1.58 MB
|
|
Thermistor Production Test Using the Agilent B2911A
This technical overview shows how to use the Agilent B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test.
應用手冊 2013-01-07 |
PDF
1.33 MB
|
|
Characterization of Bipolar Transistors Using the Agilent B2912A
This technical overview describes the characterization of Bipolar transistors using the B2900a precision source/measure units.
應用手冊 2013-01-07 |
PDF
1.92 MB
|
|
Diode Production Test Using the Agilent B2911A
This technical overview shows how to use the Agilent B2900A Series Precision SMU for production diode test, in addition to the features that make it well-adapted for production test.
應用手冊 2013-01-07 |
PDF
1.65 MB
|
|
LED Production Test Using the Agilent B2911A
This technical overview describes LED production test using the B2900A series precision source/measure unit.
應用手冊 2013-01-07 |
PDF
1.69 MB
|
|
Resistor Production Test Using the Agilent B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test.
應用手冊 2013-01-07 |
PDF
1.29 MB
|
|
Varistor Production Test Using the Agilent B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test.
應用手冊 2013-01-07 |
PDF
1.13 MB
|
|
Baseband Up-Conversion to Desired Intermediate Frequency with Regard to Signal Quality and Play Time
Modulation bandwidth are increasing without compromising signal fidelity. this paper compares the different up-conversion methods to get best signal fidelity in the desired frequency range.
應用手冊 2012-12-03 |
PDF
546 KB
|
|
Frequency Agile Complex Signal Simulation with the Agilent M8190A Arbitrary Waveform Generator
The Agilent M8190A Arbitrary Waveform Generator (AWG) generates complex, realistic test signals needed for today's sophisticated signal simulation and system test. Keywords: Arbitrary Waveform Generator,Long play time, frequency agile switching,signal scenario generator
應用手冊 2012-11-29 |
PDF
636 KB
|
|
Testing Circuit Board Power Distribution Using Real World Distortions - Application Note
Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits.
應用手冊 2012-11-26 |
PDF
368 KB
|
|
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.
應用手冊 2012-10-15 |
|
|
VI emulation mode of programmable output resistance function
This application note describes how to use the VI emulation mode of programmable output resistance function featured in B2961A/62A with some application examples.
應用手冊 2012-10-01 |
PDF
800 KB
|
|
Constant mode of programmable output resistance function
This application note describes how to use the constant mode of programmable output resistance function featured in B2961A/62A with some application examples.
應用手冊 2012-10-01 |
PDF
468 KB
|
註冊myAgilent
註冊您的產品
為何選擇向安捷倫採購