Discutez avec un expert

Support technique

Test et mesure électronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

Affiner la liste

retirer tout le raffinement

Par application

Par type de contenu

51-75 sur 145

Sort:
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Notes d’application 2007-02-02

HSDPA RF Measurements for User Equipment
This application note explains the meaning and purpose of the new industry standards for RF conformance tests of HSDPA-capable user equipment and provides Agilent test solutions.

Notes d’application 2007-01-18

Concepts of HSDPA
Bringing increased throughput and efficiency to W-CDMA

Notes d’application 2007-01-18

Remote Keyless Entry Application
This Application Note describes the Remote Keyless Entry (RKE) or Immobilizers applications on Agilent TS-5400 and TS-5020 Test Systems.

Notes d’application 2006-11-13

PDF PDF 100 KB
Bluetooth® RF Measurement Fundamentals (AN 1333-1)
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Notes d’application 2006-10-12

Bluetooth® Manufacturing Test, A Guide to Getting Started (AN 1333-4)
Gain an understanding of important technical issues and considerations for manufacturing Bluetooth® technology products, including what to test, how long it takes, tradeoffs, and optimizing throughput.

Notes d’application 2006-10-12

Highly Accurate Amplifier ACLR and ACPR Testing with the Agilent N5182A MXG Vector Signal Generator
This note discusses ACLR/ACPR as a key performance characteristic for power amplifiers used to test wireless communications systems and how the Agilent MXG vector signal generator is used to test them.

Notes d’application 2006-08-30

Upgrade Guide for the Agilent 8510
This 20 page Product Note describes how the 8510 systems can be upgraded from any combination of the following to another: Agilent 8510XF, 85106D, and 85107B.

Notes d’application 2006-07-13

PDF PDF 290 KB
8510 Automation Software
This Product Note provides information on measurement automation software for the 8510 network analyzer. The software controls the network analyzer and leads the user step-by-step through measurements.

Notes d’application 2006-07-13

PDF PDF 487 KB
External, low-noise, frequency dividers improve E8663B phase noise below 250 MHz
The purpose of this note is to demonstrate how to use low-noise frequency dividers with the E8663B signal generator to improve phase noise performance for frequencies less than 250 MHz.

Notes d’application 2006-05-09

Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Notes d’application 2006-05-03

How Digitally Generated Faded Signals Reduce Cost of Test (R&D only)
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.

Notes d’application 2005-08-15

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Notes d’application 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Notes d’application 2005-03-29

PDF PDF 263 KB
Testing HSDPA functionality and performance in User Equipment
The objective of this paper is to explain the meaning and the purpose of the new HSDPA performance requirements tests that are part of the HSDPA Release 5 specifications.

Notes d’application 2005-03-01

PDF PDF 2.22 MB
PSG Frequency Extensions Using mm-Wave Modules
Easy frequency extension to 110 GHz using Agilent's 83550 series Millimeter-Wave Source Modules

Notes d’application 2005-02-04

PDF PDF 334 KB
Mastering the New Base Stations: Design and Test of ADPA and Digital Transceivers for 3G Radios.
This paper examines adaptive digital pre-distortion (ADPD) technology and the test challenges associated with implementing ADPD amplifiers and digital radio transceivers.

Notes d’application 2005-02-01

PDF PDF 851 KB
WiMAX Concepts and RF Measurements
This application note reviews the RF characteristics of the 256 carrier OFDM air interface defined in 802.16-2004 and the RF parametric tests that can be performed with Agilent test solutions.

Notes d’application 2005-01-05

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Notes d’application 2004-12-21

PDF PDF 374 KB
Choosing Your Test System Software Architecture (AN 1465-4)

Notes d’application 2004-12-21

Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Notes d’application 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Notes d’application 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Notes d’application 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Notes d’application 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems: Network Configuration - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN).

Notes d’application 2004-09-14

Précédente 1 2 3 4 5 6 Page suivante