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Test & Messtechnik

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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges. Application Note 2013-04-29	PDF 1.32 MB Sprachen English \| 2013-04-29 \| PDF 1.32 MB Pусский \| 2011-09-07 \| PDF 1.07 MB
Radar Distance Test to Airborne Planes - Application Note Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry. Application Note 2013-04-11	PDF 904 KB
PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis Application Note 2013-04-08	PDF 736 KB
Pulse Parameter Definitions - Application Note Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A Application Note 2013-02-14	PDF 793 KB
Baseband Up-Conversion to Desired Intermediate Frequency with Regard to Signal Quality and Play Time Modulation bandwidth are increasing without compromising signal fidelity. this paper compares the different up-conversion methods to get best signal fidelity in the desired frequency range. Application Note 2012-12-03	PDF 546 KB
Frequency Agile Complex Signal Simulation with the Agilent M8190A Arbitrary Waveform Generator The Agilent M8190A Arbitrary Waveform Generator (AWG) generates complex, realistic test signals needed for today's sophisticated signal simulation and system test. Keywords: Arbitrary Waveform Generator,Long play time, frequency agile switching,signal scenario generator Application Note 2012-11-29	PDF 636 KB
Testing Circuit Board Power Distribution Using Real World Distortions - Application Note Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits. Application Note 2012-11-26	PDF 368 KB
Wideband Digital Pre-Distortion with Agilent SystemVue and PXI Modular Instrument Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools. Application Note 2012-10-15	PDF 1.03 MB Sprachen English \| 2012-10-15 \| PDF 1.03 MB 中文（简体） \| 2011-09-14 \| PDF 1.03 MB
33500B Series Complex Modular Generation with Low-Cost Arbitrary Waveform Generators - White Paper This white paper illustrates how the Agilent 33500 Series waveform generators with Trueform technology can be applied to generate complex modulated signals. Application Note 2012-08-27	PDF 10.18 MB Sprachen English \| 2012-08-27 \| PDF 10.18 MB 中文（简体） \| 2012-12-01 \| PDF 3 MB 日本語 \| 2012-12-26 \| PDF 2.80 MB
Simplify the Generation of High-Quality IQ Signals - Application Note Topics include Trueform technology, moving IQ signals from software to a 33500B Series waveform generator for play back, and built-in features for simulating conditions on an IQ signal for testing. Application Note 2012-08-24	PDF 620 KB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note The Agilent 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications. Application Note 2012-08-13	PDF 848 KB Sprachen English \| 2012-08-13 \| PDF 848 KB 中文（简体） \| 2009-01-01 \| PDF 541 KB 日本語 \| 2009-11-11 \| PDF 2.41 MB 中文（繁體） \| 2009-01-06 \| PDF 1.05 MB
Multi-Instrument Synchronization with the 81180A - Application Note For applications that require more than two channels, a built-in synchronization feature allows for synchronizing two 81180A arbitrary waveform generators to create a fully synchronized 4-channel system. Application Note 2011-11-04	PDF 465 KB
Stressing 1 GbE Receivers on the Physcial Layer - Application Note The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals. Application Note 2011-11-03	PDF 493 KB Sprachen English \| 2011-11-03 \| PDF 493 KB 日本語 \| 2012-04-16 \| PDF 1.41 MB
Low-Cost Test Solution for ASK/FSK Wireless Devices - Application Note Use Agilent’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices. Application Note 2011-10-25	PDF 3.80 MB Sprachen English \| 2011-10-25 \| PDF 3.80 MB 中文（简体） \| 2012-04-01 \| PDF 952 KB
Creating a Complete and Flexible Solution for WiGig Testing Application Note When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz Application Note 2011-06-13	PDF 2.18 MB Sprachen English \| 2011-06-13 \| PDF 2.18 MB 日本語 \| 2011-07-21 \| PDF 913 KB 中文（繁體） \| 2011-07-28 \| PDF 2.30 MB
Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification Agilent's Radar Library helps you with the productivity and accuracy of your radar signals. Application Note 2011-01-25	PDF 3.20 MB Sprachen English \| 2011-01-25 \| PDF 3.20 MB 中文（简体） \| 2011-01-28 \| PDF 3.20 MB
OTA Test Methods for Evaluating the Performance of MIMO User Equipment This application note discusses the theory, techniques and validation of three predominant OTA test methods including the two-stage OTA, multiple test probe OTA and reverberation chamber methods. Application Note 2010-12-17	PDF 2.10 MB
Benchmarking PXB Baseband Generator and Channel Emulator Fading Performance Application Note Application Note 2010-09-16	PDF 3.37 MB
Conduct DVB-T/H Conformance Tests with Agilent's Real-time DVB-T/H Digital Video Solution This application note provides an introduction to the performance test requirements for DVB-T/H receivers, as defined in EICTA MBRAI 2.0, and it describes test setup and configurations. Application Note 2010-04-30	PDF 904 KB
High-Performance Arbitrary Waveform Generation for RADAR and LIDAR Application Presentation given at the Aerospace and Defense Symposium in 2009. It covers radar principles and challenges, radar test systems, and Agilent solutions. Application Note 2010-02-17	PDF 1.32 MB
MIMO Channel Modeling and Emulation Test Challenges Application Note Application Note 2010-01-22	PDF 1.97 GB Sprachen English \| 2010-01-22 \| PDF 1.97 GB 中文（简体） \| 2008-11-01 \| PDF 1.75 MB
GPS Receiver Testing - Application Note This paper describes GPS receiver tests used for GPS verification. It also introduces an application capable of generating the required GPS signals for a repeatable and flexible test environment. Application Note 2010-01-04	PDF 838 KB Sprachen English \| 2010-01-04 \| PDF 838 KB 日本語 \| 2010-01-21 \| PDF 2.35 MB
CMMB Conformance Testing using the PXB with N7623B Signal Studio for Digital Video This application note introduces CMMB technologies and conformance test requirements and explains the test setup and configurations for the N5106A PXB and N7623B Signal Studio for Digital Video Application Note 2010-01-04	PDF 936 KB
Creating, Editing, Transferring Arbitrary Waveforms with Agilent U2761A Function Generator This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions. Application Note 2009-12-11
Creating Arbitrary Waveforms in the U2300A Series and U2500A Series Data Acquisition Devices This application note covers the inner workings of how waveforms and arbitrary waveforms are formed. Application Note 2009-08-01

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