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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

PDF PDF 2.02 MB
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Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.

Application Note 2013-04-29

PDF PDF 1.32 MB
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Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
PXI and AXIe Modular Instrumentation, Tested Computer List - Technical Note
This personal computer and controller selection guide has been prepared to provide the system designer with a list of tested computers that are compatible with Agilent's PXI and AXIe chassis

Application Note 2013-04-08

PDF PDF 736 KB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
Baseband Up-Conversion to Desired Intermediate Frequency with Regard to Signal Quality and Play Time
Modulation bandwidth are increasing without compromising signal fidelity. this paper compares the different up-conversion methods to get best signal fidelity in the desired frequency range.

Application Note 2012-12-03

PDF PDF 546 KB
Frequency Agile Complex Signal Simulation with the Agilent M8190A Arbitrary Waveform Generator
The Agilent M8190A Arbitrary Waveform Generator (AWG) generates complex, realistic test signals needed for today's sophisticated signal simulation and system test. Keywords: Arbitrary Waveform Generator,Long play time, frequency agile switching,signal scenario generator

Application Note 2012-11-29

PDF PDF 636 KB
Testing Circuit Board Power Distribution Using Real World Distortions - Application Note
Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits.

Application Note 2012-11-26

PDF PDF 368 KB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Agilent 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2012-08-13

PDF PDF 848 KB
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How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

PDF PDF 3.22 MB
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Multi-Instrument Synchronization with the 81180A - Application Note
For applications that require more than two channels, a built-in synchronization feature allows for synchronizing two 81180A arbitrary waveform generators to create a fully synchronized 4-channel system.

Application Note 2011-11-04

PDF PDF 465 KB
Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2011-11-03

PDF PDF 493 KB
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
81150A and 81160A Arbitrary Bit-Shape Pattern Generator Application Note
The optional 81150A and 81160A Arbitrary Bit-Shape Pattern Generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.

Application Note 2011-09-20

PDF PDF 709 KB
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Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Application Note 2011-09-01

PDF PDF 2.20 MB
Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

PDF PDF 4.82 MB
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Creating a Complete and Flexible Solution for WiGig Testing Application Note
When developing new WiGig products, testing must address the transmitter and receiver portions of each device. In a tri-band device, signals have three key attributes: they operate at 2.4 GHz, 5.0 GHz

Application Note 2011-06-13

PDF PDF 2.18 MB
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Using SystemVue’s Radar Library to Generate Signals for Radar Design and Verification
Agilent's Radar Library helps you with the productivity and accuracy of your radar signals.

Application Note 2011-01-25

PDF PDF 3.20 MB
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Error Detection Up to 28.4 Gb/s During Receiver Test with the Agilent J-BERT
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.

Application Note 2010-09-16

PDF PDF 3.32 MB
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MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009
MOI for SATA RSG Tests, SATA Interoperability Program rev. 1.4 - Sep 2009

Application Note 2009-09-17

PDF PDF 2.12 MB
Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2009-03-24

PDF PDF 606 KB
PCI Express® Revision 2 - Receiver Testing With J-BERT N4903A and 81150A Pulse

Application Note 2008-12-03

PDF PDF 1000 KB
Using IVI For Your Instrument Driver
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

PDF PDF 344 KB
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Upgrade to PCI Express 2.0© Receiver Test
The 15431A is a filter set for the 81150A. It generates the random jitter profile for testing PCI Express 2.0 receivers, to be used in conjunction with the N4903A. This fact sheet explains the upgrade.

Application Note 2008-10-24

PDF PDF 348 KB
New Noise Technology and Its Application

Application Note 2008-09-12

PDF PDF 641 KB

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