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26-50 of 58

Calibrating optical stress signals for characterizing 10 Gb/s optical transceivers Application Note 2008-06-10	PDF 1.95 MB Languages English \| 2008-06-10 \| PDF 1.95 MB 中文（简体） \| 2008-06-10 \| PDF 1.95 MB
Flexible Signal Conditioning with the Help of the Agilent 81134A Pulse Pattern Generator Application Note 2008-06-01	PDF 893 KB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.3 Agilent Method Of Implementation for SATA RSG Tests, Serial ATA Interoperability Program Revision 1.3 Application Note 2008-05-30	PDF 2.17 MB
Measuring Jitter in Digital Systems (AN 1448-1) Measuring jitter and how to calculate total jitter. Application Note 2008-01-30	PDF 1.91 MB
81133A/81134A Firmware Revision History 81133A/81134A Firmware Revision History Application Note 2007-11-30	PDF 14 KB
Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices Using Receiver Tolerance Testing to Assess the Performance of High-Speed Devices Application Note 2007-06-19	PDF 214 KB
Evaluation Methods for Automotive Network Topologies Agilent Evaluation Methods for Automotive Network Topologies Application Note 2007-05-03	PDF 1.79 MB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages Application Note 2007-01-31	PDF 272 KB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4) This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ... Application Note 2006-12-12	PDF 382 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past. Application Note 2006-07-18	PDF 5.33 MB
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing 81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing Application Note 2006-06-01	PDF 396 KB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices. Application Note 2006-01-30	PDF 1.31 MB Languages English \| 2006-01-30 \| PDF 1.31 MB 中文（简体） \| 2009-04-01 \| PDF 737 KB 中文（繁體） \| 2009-05-18 \| PDF 1.44 MB
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester. Application Note 2005-09-21	PDF 356 KB
Fast Total Jitter Test Solution This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement Application Note 2005-08-29	PDF 1.28 MB
Pulse Testing 980-nm Pump Laser Diodes in Optical Fiber Amplifiers (AN 1268) This Application Note describes how the Agilent 8114A Pulse Generator is being used by Norwegian Telecom to pulse test unmounted 980-nm laser-diodes which are used in optical fiber amplifiers. Application Note 2005-05-03	PDF 87 KB
PCI Express Receiver Design Validation Test with 81134A / 81250A Describes functional validation and compliance and stress tests for PCI Express receiver design Application Note 2005-03-18	PDF 2.01 MB Languages English \| 2005-03-18 \| PDF 2.01 MB 日本語 \| 2002-09-10 \| PDF 707 KB
81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ... Application Note 2004-10-18	PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane. Application Note 2004-10-12	PDF
Advanced Jitter Generation and Analysis Product Note This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope. Application Note 2004-10-04	PDF 549 KB
Magneto-Optical Disk Drive Research (PN 3) This 4-page Product Note describes how the Agilent 81100 family of pulse/pattern generators can be used together with an Agilent Infinium oscilloscope to help magneto-optical disk drive. Application Note 2004-07-29	PDF 275 KB
Test signals for multi-input digital devices Designed for characterizing digital circuits in the lab and in the automatic test environment, the Agilent 8110A pulse generator has extensive functionality and high parametric performance. Its small size and weight pair well with Agilent's oscilloscopes so that a powerful stimulus-response tool... Application Note 2004-02-20	PDF 21 KB
Programmable Stimuli for Stress-testing and Component Evaluation (AN 1251) Will a flash memory still be good after a hundred thousand operations? Does a switching diode switch quickly enough to avoid burning energy on the reverse part of the cycle? How much does a resistor change its value when a pulse is applied? What is the performance of a laser, and how much energy... Application Note 2004-02-20	PDF 15 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals. Application Note 2003-06-30	PDF 1.70 MB Languages English \| 2003-06-30 \| PDF 1.70 MB 日本語 \| 2003-09-22 \| PDF 1.51 MB
Jitter Analysis Techniques for High Data Rates (AN 1432) This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications. Application Note 2003-02-03	PDF 4 MB Languages English \| 2003-02-03 \| PDF 4 MB 日本語 \| 2003-04-28 \| PDF 1.65 MB
How to Generate Real World Signals With the Agilent 8110A (PN 8110A) Within this Product Note you will find information about the Agilent 8110A 150 MHz Pulse Pattern Generator performing the following applications: Dual clock GBIT Test Flash memory cell endurance... Application Note 2002-11-25	PDF 462 KB

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