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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2013-05-10

PDF PDF 2.02 MB
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Double Pulse Generation for Particle Image Velocimetry (PIV) Measurements - Technical Overview
Agilent Technologies' Pulse/Pattern Generators are used for research in the aerospace and defense industry, among others.

Technical Overview 2013-05-06

PDF PDF 2.67 MB
Simulation of Jittering Synchronization Signals for Video Interfaces - Technical Overview V2.0
This product note describes how R&D engineers in the communication industry use Agilent Technologies pulse generators for development of video interfaces for projection units.

Technical Overview 2013-04-24

PDF PDF 834 KB
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
J-BERT N4903B High-Performance Serial BERT - Data Sheet Version 1.3
This data sheet documents the capabilities of the N4906B, Agilent's high-performance serial BERT for R&D characterization compliance testing and for manufacturing volume ramp testing.

Data Sheet 2013-04-10

PDF PDF 1.90 MB
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Lightwave Catalog: Optical-Electrical/Polarization/Complex Modulation Analysis 2013 Vol 2 - Catalog
Volume II covers “Optical –Electrical/ Polarization/ Complex Modulation Analysis“ for the transmission networks..

Catalog 2013-03-01

PDF PDF 3.31 MB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Data Sheet, Ver. 1.0
The Agilent 81160A is a pulse function arbitrary noise generator with 330 MHz pulses and 500 MHz sine waves. The unique functionality of this 4-in1 instrument increases test efficiency and confidence. Additional keywords: 81160A,Pulse Generator,Function Generator,Noise Generator, Arbitrary Generator

Data Sheet 2013-01-28

PDF PDF 1.30 MB
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Pulse Pattern Generators - Selection Guide
This document is aimed to offer an overview of Agilent's Pulse Pattern Generator portfolio in all speed ranges, from low to high.

Selection Guide 2013-01-25

PDF PDF 100 KB
N5990A Test Automation Software Platform - Data Sheet, Version 3.1
An efficient test strategy is a proven competitive advantage. Agilent's N5990A Test Automation Software Platform is a key element of winning strategies.

Data Sheet 2013-01-23

PDF PDF 1.54 MB
J-BERT N4903B High-Performance Serial BERT - User's Guide
The Serial BERT can help you test the performance of components and systems for high-speed digital transmission equipment. An important parameter of a digital system is the rate at which errors occur in the system. The analyzer will compare the bits sent to your device with the bits received from your device. It will record the number of bit errors and display results such as the bit error ratio (BER). In addition, accumulated results can be analyzed to help you determine what caused the bit errors. (Verison 7.40)

User Manual 2013-01-01

PDF PDF 7.83 MB
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J-BERT N4903B High-Performance Serial BERT - Programming Guide
Released with N4903B Software 7.40. This document provides the information you need for programming the Serial BERT using the Agilent IO Libraries Suite. Familiarity with the Agilent IO Libraries Suite is instrumental in understanding remote programming of the Serial BERT. See the user documentation delivered with the Agilent IO Libraries Suite for information on how to use them.

Programming and Syntax Guide 2013-01-01

PDF PDF 5.26 MB
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N4903B J-BERT Getting Started Guide
Revision 10 (Released with N4903B Software 7.40).

Quick Start Guide 2013-01-01

PDF PDF 6.79 MB
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Testing Circuit Board Power Distribution Using Real World Distortions - Application Note
Noisy, fluctuating or, generally speaking, distorted DC power levels will affect the operation of Integrated Circuits (ICs). Here is a proposal how to test the immunity of compensation circuits.

Application Note 2012-11-26

PDF PDF 368 KB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note
The Agilent 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2012-08-13

PDF PDF 848 KB
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N4917A Optical Receiver Stress Test Solution Data Sheet Version 1.3
N4917A optical receiver stress test solution allows repeatable and accurate optical stress for receiver tolerance test of 10GbE 802.3ae -LR, -ER, -SR, 8G, and 10G FC transceivers.

Data Sheet 2012-05-23

PDF PDF 1.78 MB
Pulse Function Arbitrary Noise Generator Demo
The Agilent 81150A Pulse Function Arbitrary Noise Generator is a new 3-in-1 instrument, offering accurate Pulse, Function Arbitrary and Noise Generation in a single box.

Demo 2012-05-21

Video - Glitch free changing of timing parameters
How to change timing parameters in real time and without glitches with the new 81160A Pulse Function Arbitrary Noise Generator

Demo 2012-04-26

N4880A Reference Clock Multiplier Data Sheet
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Data Sheet 2012-04-16

PDF PDF 3.31 MB
81133A and 81134A, 3,35 GHz Pulse-/Pattern Generators - Data Sheet
81133A and 81134A, 3,35 GHz Pulse-/Pattern Generators Data Sheet

Data Sheet 2012-03-14

PDF PDF 595 KB
81133A and 81134A, 3.35 GHz Pulse Pattern Generators
81133A and 81134A 3.35 GHz Pulse Pattern Generators. The need for pulse and pattern generation is fundamental to any device characterization task.The ability to emulate the pulse and pattern conditions to which the device will be subjected is essential.This emulation should include both typical and worst case conditions.Such accurate emulation requires superlative signal integrity and timing performance along with full control over parameters that allow specific worst case testing.

Data Sheet 2012-03-14

PDF PDF 1.40 MB
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Pulse Pattern and Function Arbitrary Generators and Arbitrary Waveform Generator
This Agilent family of pulse/pattern generators can help you verify and characterize digital or analog systems, products, and components.

Brochure 2012-01-27

PDF PDF 1.48 MB
N2101B 10.3125 Gb/s Bit Error Ratio Tester - Data Sheet
The N2101B PXIT 10.7 Gb/s Bit Error Ratio Tester consists of a high accuracy clock source, data pattern generator, and error detector. It will automatically perform bit error ratio analysis to characterize the quality of devices at 10 standard internal rates from 155 Mb/s to 8.5 Gb/s.

Data Sheet 2012-01-27

PDF PDF 150 KB
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PCI Express Design and Test - From Electrical to Protocol
Agilent's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Agilent's PCIe solutions.

Brochure 2012-01-17

PDF PDF 1.26 MB
Agilent 81150A Pulse Function Noise Generator - Connectivity Demo
This video provides you with an onscreen insight into LXI Class C and IntuiLink connectivity, using the new Agilent 81150A pulse function arbitrary noise generator.

Demo 2011-12-07

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