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Data Generators & Analyzers
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- Specifications (29)
- Manuals (51)
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- Brochures & Competitive Overviews (18)
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- Demos (19)
- Articles & Case Studies (2)
- Catalogs (1)
- Press Releases (4)
By Product Category
- 81160A Pulse Function Arbitrary Noise Generator (14)
- Transition Time Converters (2)
- 81110A Pulse Pattern Generator, 165/330 MHz (21)
- 81104A Pulse Pattern Generator, 80 MHz [Discontinued] (13)
- 81130A Pulse Data Generator, 400/660 MHz and 1.32 Gb/s (20)
- 81133A Pulse Pattern Generator, 3.35 GHz, single channel (25)
- 81134A Pulse Pattern Generator, 3.35 GHz, dual-channel (30)
- 81250 13.5 Gb/s ParBERT Modules (N4872A, N4873A) (6)
- 81250 7 Gb/s ParBERT Modules (N4874A, N4875A) (2)
- 81250 3.35 Gb/s ParBERT Modules (E4861B, E4862B, E4863B) (18)
- PCI Express® Gen 2.0 RX jitter testing with J-BERT N4903B (3)
- N4903B J-BERT high-performance serial BERT up to 7 Gb/s and 12.5 Gb/s with complete jitter tolerance (31)
- 81150A Pulse Function Arbitrary Noise Generator (41)
- N2102B PXIT Pattern Generator (6)
- 81250 675 Mb/s ParBERT Modules (E4832A, E4835A, E4838A) (15)
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Agilent 81150A Pulse Function Noise Generator - Connectivity Demo
This video provides you with an onscreen insight into LXI Class C and IntuiLink connectivity, using the new Agilent 81150A pulse function arbitrary noise generator.
Demo 2011-12-07 |
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How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.
Application Note 2011-11-30 |
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N2102B Pattern Generator
This flyer provides a brief description of the features and benefits of the N2102B Pattern Generator
Brochure 2011-11-27 |
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Stressing 1 GbE Receivers on the Physcial Layer - Application Note
The optional 81150A and 81160A arbitrary bit-shape pattern generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.
Application Note 2011-11-03 |
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
Application Note 2011-10-28 |
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81150A and 81160A Arbitrary Bit-Shape Pattern Generator Application Note
The optional 81150A and 81160A Arbitrary Bit-Shape Pattern Generators allow designers to test in a minimum of time and at low cost the robustness of their devices with repeatable real-world signals.
Application Note 2011-09-20 |
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Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper
Application Note 2011-09-01 |
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N4915A-014 PCI Express 3.0® Calibration Channels
The N4815A-014 PCI Express 3.0 calibration channels allow to generate receiver stress conditions according to PCIe 3.0 base specification rev 1.0 when used together with J-BERT N4903B and N4916B.
Data Sheet 2011-07-05 |
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Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.
Application Note 2011-06-22 |
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Agilent 81150A and 81160A Pulse Function Arbitrary Noise Generator Demo Guide
The 81150A and 81160A Pulse Function Arbitrary Noise Generator provides high signal integrity to provide clear and stable repetitive signals. Furthermore any stress test and real world signal can be generated to stress your Device to its limit. Learn how to set up a 81150A demo with 4 examples: - combine 2 independent output channels - generate customer based waveforms and add noise.
Demo 2011-04-19 |
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N4916B De-emphasis Signal Converter Data Sheet
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.
Data Sheet 2011-04-13 |
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81150A and 81160A Pulse Function Arbitrary Noise Generator User Guide
User Manual 2011-03-01 |
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81150A and 81160A Pulse Function Arbitrary Noise Generator Getting Started Guide
Quick Start Guide 2011-03-01 |
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81150A Pulse Function Arbitrary Noise Generator - Quick Fact Sheet
A 3-in-1 device for accelerated and accurate insight into your device
Promotional Materials 2010-11-22 |
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81110A Pulse Pattern Generator - Quick Fact Sheet
The Agilent 81110A pulse pattern generator is the industry-standard for pulse, pattern, data and PRBS generation up to 165/330 MHz.
Promotional Materials 2010-11-22 |
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PXIT 10.3125 Gb/s Pattern Generator N2102B and PXIT Synthesizer N2099A Data Sheet
The N2102B PXIT Pattern Generator is a 2-slot PXI module capable of generating a number of industry standard patterns with very low jitter, from 622 Mb/s to 11.1 Gb/s. The N2099A PXIT Synthesizer is a 2-slot PXI module with dual RF outputs, tunable over a 2 GHz range.
Data Sheet 2010-09-20 |
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Error Detection Up to 28.4 Gb/s During Receiver Test with the Agilent J-BERT
J-BERT N4903B pattern generation is extended up to 28.4 Gb/s with second channel Option 002 and N4876A 2:1 Mux. The single 12.5 Gb/s ED can easily be used during RX test utilizing under-sampling.
Application Note 2010-09-16 |
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Discover the Alternatives in Automated Measurements and Testing
Discover the Alternatives in Automated Measurements and Testing
Brochure 2010-08-17 |
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HDMI and DisplayPort Design and Test - A Better Way Brochure
Brochure covering Agilent's HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
Brochure 2010-05-20 |
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Press Releases for 81134A
Press Materials 2010-04-29 |
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Press Releases for 81150A
Press Materials 2010-04-29 |
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Serial ATA Design and Test - A better way
Agilent's SATA test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.
Brochure 2009-12-08 |
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Device Characterization and Verification with the Agilent 81200
This Application Note originally was an article that appeared in the January issue of Microwave Product Digest. The Note shows you how to do device characterization and verification with the Agilent 81200 Data Generator/Analyzer Platform.
Article 2009-11-25 |
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81100 Family Pulse/Pattern Generator Technical Specifications
81100 Family Pulse/Pattern Generator Technical Specifications
Data Sheet 2009-11-24 |
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Press Releases for N4903B
Press Releases for N4903B
Press Materials 2009-11-11 |
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