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Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
Simulation of Jittering Synchronization Signals for Video Interfaces (PN 4)
This Product Note shows how Research and Development engineers use pulse generators of the Agilent 81100 Family for the development of interfaces ...

Application Note 2006-12-12

PDF PDF 382 KB
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A
This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

Application Note 2006-07-18

PDF PDF 5.33 MB
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing
81110A Pulse Pattern Generator-Simulating Distorted Signals for Tolerance Testing

Application Note 2006-06-01

PDF PDF 396 KB
PCIe Revision 2 Receiver Jitter Tolerance Testing with J-BERT N4903B
This document focuses on physical layer testing of the transmitter (TX) and receiver (RX) ports of PCI EXPRESS® (PCIe) devices.

Application Note 2006-01-30

PDF PDF 1.31 MB
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Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode
Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.

Application Note 2005-09-21

PDF PDF 356 KB
Fast Total Jitter Test Solution
This application note compares different total jitter measurement and extrapolation techniques to the Fast Total Jitter Measurement

Application Note 2005-08-29

PDF PDF 1.28 MB
81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2)
In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ...

Application Note 2004-10-18

PDF PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1)
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
Advanced Jitter Generation and Analysis Product Note
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Mux/Demux test with the Agilent 81250, ParBERT
In this Application Note Mux/Demux is described as an important part of communication. The Agilent ParBERT 81250 is the only Parallel Bit-Error-Rate test solution for 660 MHz, 1.3 and 2.6 GBit/s.

Application Note 2004-08-04

PDF PDF 117 KB
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Magneto-Optical Disk Drive Research (PN 3)
This 4-page Product Note describes how the Agilent 81100 family of pulse/pattern generators can be used together with an Agilent Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PDF PDF 275 KB
Flat Panel Display Link Test
This Product Note shows how to verify the Bit Error Rate (BER) of 1-serial to 7-parallel Rx chip with the Agilent 81250 Parallel Bit Error Ratio Tester (ParBERT).

Application Note 2004-07-29

PDF PDF 128 KB
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Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2)
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

PDF PDF 1.70 MB
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10GbE Technology and Device Characterization with the 81250 ParBERT
A wide range of measurements are described in the 802.3ae Standard, including optical transmitter and receiver testing, electrical XAUI test are essentially eye mask measurements.

Application Note 2003-04-22

PDF PDF 1.91 MB
Jitter Analysis Techniques for High Data Rates (AN 1432)
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

PDF PDF 4 MB
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81250 ParBERT System Setup Examples
This is a collection of examples on how to use the Agilent 81250 Parallel Bit Error Ratio Tester for various applications.

Application Note 2002-12-12

PDF PDF 1.02 MB
Pulse Parameter Definitions
Definitions of Terms used with Pulse/Pattern/Data Generators

Application Note 2002-04-08

How to use the Agilent 81200 together with Agilent VEE
This attached Product Note shows how to use the Agilent 81200 Data Generator/Analyzer together with Agilent VEE for Signal Integrity Analysis.

Application Note 2002-01-28

PDF PDF 383 KB
When Digital Goes Analog: How to deal with signals which have two or more states
This Product Overview explains the benefits of using the Agilent 81200 with help from the E4838A generator front-end, to enable to generation of multi-level signals.

Application Note 2002-01-11

PDF PDF 485 KB
BestLink/81200: Simulation Data Link for 81200 Data Generator/Analyzer Platform
The BestLink/81200 provides for an intelligent and highly automated migration of simulation data to the Agilent 81200.

Application Note 2001-04-06

Transition-time Converters
The Agilent 15432B, 15433B, 15434B, 15435A, and 15438A are converters that have been designed to convert

Application Note 2001-03-27

Measuring Jitter with the Agilent E4874A Characterization Software Components
The Product Note shows how to measuring jitter with the Agilent E4874A Characterization Software Components on the Agilent 81200 Data Generator/Analyzer Platform. See also R & D Central at: http://www.agilent.com/find/randd Select "Bit Error Ratio Testing (BERT)" on that page. Then...

Application Note 2000-06-01

PDF PDF 102 KB
Implementation of UTOPIA level 2 with Agilent E4829B

Application Note 1997-02-01

PDF PDF 603 KB
Implementation of UTOPIA Level 2 for Parallel Cell/Traffic Generator and Analyzer
See the attached Product Note for information on the Agilent E4821A #502 Connectivity Kit to interface with the Agilent E4829B Parallel Cell/Traffic Generator and Analyzer. Note: Different Pin-count of 80-pin connector versus 40-pin connector! When you design DUT boards to be connected either...

Application Note 1997-02-01

PDF PDF 603 KB

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