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Overvoltage Protection in Power Supplies - Application Note
This application brief describes over-voltage protection as a useful feature to protect your DUTs in some commonly used applications

Application Note 2013-04-18

PDF PDF 832 KB
Power Essentials Resource Kit
A collection of technical content and tools to help you get the most out of your bench or system power supply.

Application Note 2013-04-03

Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

Application Note 2013-04-01

PDF PDF 476 KB
Constant mode of programmable output resistance function
This application note describes how to use the constant mode of programmable output resistance function featured in B2961A/62A with some application examples.

Application Note 2012-10-01

PDF PDF 468 KB
VI emulation mode of programmable output resistance function
This application note describes how to use the VI emulation mode of programmable output resistance function featured in B2961A/62A with some application examples.

Application Note 2012-10-01

PDF PDF 800 KB
Using the U8030 Series Power Supply Output Sequencing Feature Application
This document presents three test applications that demonstrate the output sequencing capability of the U8030 Series power supply.

Application Note 2012-01-04

PDF PDF 771 KB
Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2011-03-28

PDF PDF 647 KB
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Solving the Challenges of Solar Array Simulation
Solving the Challenges of Solar Array Simulation defines the optimal power solution for satellite ground testing.

Application Note 2010-06-07

PDF PDF 264 KB
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Power Toolbox for Embedded System Design, Dynamic Current Profiling
This is the 2nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; focusing on dynamic current profiling.

Application Note 2009-12-15

PDF PDF 768 KB
Creating, Editing, Transferring Arbitrary Waveforms with Agilent U2761A Function Generator
This application note explores how a complex arbitrary waveform is created by using software, importing, reusing existing waveform files and easily programs your instrument with the free Command Logger and Code Converter functions.

Application Note 2009-12-11

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

PDF PDF 1.04 MB
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Base Station Subassemblies: Addressing DC Power Test Challenges
This application note addresses the numerous DC power-related challenges that base station providers are faced with during development and production test of their subassemblies.

Application Note 2009-11-16

PDF PDF 382 KB
I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

Application Note 2009-09-30

PDF PDF 378 KB
3GPP Long Term Evolution: System Overview, Product Development and Test Challenges
This application note focuses on LTE and includes content on system overview, product development and test challenges of this new wireless communications technology.

Application Note 2009-09-08

PDF PDF 3.69 MB
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Power Toolbox for Embedded System Design-Simulating Power Supply Interrupts
This is the 3nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; specifically preventing power supply interrupts

Application Note 2009-08-21

PDF PDF 482 KB
Managing High-Power DC Requirements for Life and Durability Test Systems
New product life and durability testing (Life testing) is critical in highly competitive markets.

Application Note 2009-08-04

PDF PDF 181 KB
Selecting DC Sources for Telecommunications Equipment Test Systems Application Note
When selecting DC sources for test systems, one must take industry standards on DC power into consideration. The Agilent N5700 and N8700 series DC Sources offer a wide choice of power and voltage levels.

Application Note 2009-07-22

PDF PDF 204 KB
Power Sources for Energy-Efficient High Input Voltage Equipment Development Application Note
Telecommunications equipment developers face several challenges when selecting power sources for test systems for developing new telecommunications equipment for network installations employing high voltage power distribution.

Application Note 2009-07-22

PDF PDF 302 KB
Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

PDF PDF 1000 KB
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Power Toolbox for Embedded System Designs
Properly Powering On and Off Multiple Power Inputs in Embedded Designs

Application Note 2009-06-01

PDF PDF 163 KB
Languages 
Testing Terrestrial Solar-Powered Inverters Using Solar Array Simulation Techniques
This application note describes how to test terrestrial solar-powered inverters using solar array simulation techniques.

Application Note 2009-06-01

PDF PDF 220 KB
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Using Two Power Supplies for Higher Current Solar Cell Characterizing
This application note describes the Agilent 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Application Note 2009-04-29

PDF PDF 280 KB
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Generating I-V Curves with the Agilent E4360A Solar Array Simulator Using the Parameters Voc, Isc, N

Application Note 2009-03-12

E3600 Series Low Noise Power Supply
The app note describe the two common types of power supply topologies. E3600 Series exhibits lower noise due to its linear topology to minimize signal distortion.

Application Note 2008-12-17

PDF PDF 270 KB
Sequential Shunt Regulation - Regulating Satellite Bus Voltages

Application Note 2008-10-08

PDF PDF 326 KB
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