Technical Support

Test & Messtechnik

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Choosing System DC Power Supplies to Optimize System Integration and Performance - Application note Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system. Application Note 2013-04-01	PDF 476 KB
Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device. Application Note 2011-03-28	PDF 647 KB Sprachen English \| 2011-03-28 \| PDF 647 KB 日本語 \| 2011-06-10 \| PDF 1.57 MB
Power Toolbox for Embedded System Design, Dynamic Current Profiling This is the 2nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; focusing on dynamic current profiling. Application Note 2009-12-15	PDF 768 KB
Solar Cell and Module Testing This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions. Application Note 2009-12-07	PDF 1.04 MB Sprachen English \| 2009-12-07 \| PDF 1.04 MB 中文（简体） \| 2009-03-01 \| PDF 950 KB 日本語 \| 2009-03-18 \| PDF 2.53 MB 한국어 \| 2008-12-15 \| PDF 1.04 MB
Base Station Subassemblies: Addressing DC Power Test Challenges This application note addresses the numerous DC power-related challenges that base station providers are faced with during development and production test of their subassemblies. Application Note 2009-11-16	PDF 382 KB
I-V Curve Characterization in High-Power Solar Cells and Modules This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test. Application Note 2009-09-30	PDF 378 KB
Power Toolbox for Embedded System Design-Simulating Power Supply Interrupts This is the 3nd in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded design; specifically preventing power supply interrupts Application Note 2009-08-21	PDF 482 KB
Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications Application Note 2009-06-05	PDF 1000 KB Sprachen English \| 2009-06-05 \| PDF 1000 KB 日本語 \| 2009-07-08 \| PDF 1.36 MB
Power Toolbox for Embedded System Designs Properly Powering On and Off Multiple Power Inputs in Embedded Designs Application Note 2009-06-01	PDF 163 KB Sprachen English \| 2009-06-01 \| PDF 163 KB 日本語 \| 2009-07-24 \| PDF 515 KB
Using Two Power Supplies for Higher Current Solar Cell Characterizing This application note describes the Agilent 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing. Application Note 2009-04-29	PDF 280 KB Sprachen English \| 2009-04-29 \| PDF 280 KB 日本語 \| 2009-06-08 \| PDF 814 KB
Simulating Power Interruptions for DC Input Devices This application brief describes how the Agilent N6705A DC Power Analyzer can simulate power inter-ruptions for DC input devices. Application Note 2008-09-25	PDF 259 KB Sprachen English \| 2008-09-25 \| PDF 259 KB 日本語 \| 2007-06-05 \| PDF 537 KB 中文（繁體） \| 2007-08-17 \| PDF 259 KB
Automotive ECU Transient Testing Using Captured Power System Waveforms Application Note 2008-01-10	PDF 939 KB Sprachen English \| 2008-01-10 \| PDF 939 KB 日本語 \| 2008-01-29 \| PDF 2.06 MB
Comparing the N6700 Low-Profile and DC Power Analyzer Mainframes Application Note 2008-01-10	PDF 237 KB Sprachen English \| 2008-01-10 \| PDF 237 KB 日本語 \| 2008-01-29 \| PDF 653 KB
FPGA Circuit Design: Overcoming Power-Related Challenges Application Note 2008-01-09	PDF 627 KB Sprachen English \| 2008-01-09 \| PDF 627 KB 中文（简体） \| 2008-04-14 \| PDF 932 KB 日本語 \| 2008-01-28 \| PDF 1.87 MB
Avoid DUT Damage by Sequencing Multiple Power Inputs Off Upon a Fault Event Having the ability to control the power supply system itself can greatly reduce the effort and complexity associated with an external shut-down control method. Application Note 2007-12-05	PDF 163 KB Sprachen English \| 2007-12-05 \| PDF 163 KB 中文（简体） \| 2007-12-01 \| PDF 459 KB
10 Practical Tips You Need to Know about Your Power Products Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads. Application Note 2007-09-21	PDF 708 KB Sprachen English \| 2007-09-21 \| PDF 708 KB 中文（简体） \| 2000-08-01 \| PDF 576 KB 日本語 \| 2013-03-27 \| PDF 751 KB 中文（繁體） \| 2003-02-02 \| PDF 576 KB
Biasing Multiple Input Voltage Devices in R&D This application brief describes using the voltage output synchronization capabilities of modular power supplies in R & D multiple bias applications. Application Note 2007-05-07	PDF 206 KB Sprachen English \| 2007-05-07 \| PDF 206 KB 日本語 \| 2007-06-04 \| PDF 442 KB 中文（繁體） \| 2007-08-17 \| PDF 206 KB
Accelerate Vehicle Charging System Simulation with the N6705A DC Power Analyzer This application brief describes how the Agilent N6705A DC Power Analyzer can simulate vehicle charging system power waveforms for R & D electrical component testing. Application Note 2007-04-30	PDF 183 KB Sprachen English \| 2007-04-30 \| PDF 183 KB 中文（简体） \| 2007-05-07 \| PDF 436 KB 日本語 \| 2007-06-01 \| PDF 357 KB 中文（繁體） \| 2007-08-17 \| PDF 183 KB
Cathodic Protection of Steel in Concrete Using LXI This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion. Application Note 2007-04-25	PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer Application Note 2007-04-25	PDF 234 KB
Powering DC-to-DC Converters Using the Agilent N6705A DC Power Analyzer This application brief describes an example of how an R&D engineer can test DC-to-DC converters using capabilities of the N6705A DC Power Analyzer. Application Note 2007-04-11	PDF 188 KB Sprachen English \| 2007-04-11 \| PDF 188 KB 中文（简体） \| 2007-05-07 \| PDF 490 KB 日本語 \| 2007-05-29 \| PDF 362 KB 中文（繁體） \| 2007-08-17 \| PDF 188 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems. Application Note 2007-02-23	PDF 234 KB Sprachen English \| 2007-02-23 \| PDF 234 KB 中文（简体） \| 2007-07-04 \| PDF 625 KB 日本語 \| 2005-02-17 \| PDF 960 KB
Testing LCD Backlight Inverters using the Agilent N6700 Modular Power System (MPS) Application Note 2005-12-09	PDF 171 KB Sprachen English \| 2005-12-09 \| PDF 171 KB 中文（简体） \| 2006-08-01 \| PDF 395 KB 日本語 \| 2005-12-21 \| PDF 195 KB 中文（繁體） \| 2006-01-11 \| PDF 348 KB
N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) Application Note 2005-07-27	PDF 110 KB Sprachen English \| 2005-07-27 \| PDF 110 KB 中文（简体） \| 2006-08-01 \| PDF 442 KB 日本語 \| 2006-04-12 \| PDF 332 KB
Understanding Linear Power Supply Operation Understanding Linear Power Supply Operation – An eight page tutorial on understanding and making better use of your supply. Application Note 2005-02-07	PDF 94 KB Sprachen English \| 2005-02-07 \| PDF 94 KB 中文（简体） \| 2006-08-22 \| PDF 493 KB 日本語 \| 2005-05-13 \| PDF 290 KB 한국어 \| 2005-02-07 \| PDF 94 KB

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