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Electronic Measurement

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Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Radar Distance Test to Airborne Planes - Application Note
Agilent pulse pattern generators are used for testing military radar communication systems, and as demonstrated in this publication, the aviation industry.

Application Note 2013-04-11

PDF PDF 904 KB
Pulse Parameter Definitions - Application Note
Here you find the pulse parameter definitions of terms used in the instrument specifications of Pulse Pattern Generators. Model Nos: 81110A, 81111A, 81112A, 81150A, 81160A, 81130A, 81131A, 81132A, 81133A, 81134A, 81180B, M8190A

Application Note 2013-02-14

PDF PDF 793 KB
PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.

Application Note 2011-10-28

PDF PDF 1.01 MB
Using IVI For Your Instrument Driver - Application Note
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Flexible Signal Conditioning with the Help of the Agilent 81134A Pulse Pattern Generator - App Note
This application note describes how to set up the Agilent 81134A 3.35GHz Pulse Pattern Generator for different signal conditions.

Application Note 2008-06-01

PDF PDF 893 KB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.3 - Application Note
Agilent Method Of Implementation for SATA RSG Tests, Serial ATA Interoperability Program Revision 1.3

Application Note 2008-05-30

PDF PDF 2.17 MB
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A - App Note
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform: 8 pages

Application Note 2007-01-31

PDF PDF 272 KB
Advanced Jitter Generation and Analysis Product Note - Application Note
This product note shows how the Agilent pulse generators can be used with the DCA-J Oscilloscope.

Application Note 2004-10-04

PDF PDF 549 KB
Finding Sources of Jitter with Real-Time Jitter Analysis (AN 1448-2) - Application Note
This application note describes how to use a real-time oscilloscope with jitter analysis, along with the stimulus-response techniques, to meet the critical time-correlation requirement to relate jitter trend measurement results to measured signals.

Application Note 2003-06-30

Jitter Analysis Techniques for High Data Rates (AN 1432) - Application Note
This new application note describes the basic jitter measurements and the specific measurement techniques used in SONet/SDH/OTN and Gigabit Ethernet applications.

Application Note 2003-02-03

Pulse Parameter Definitions - Application Note
Definitions of Terms used with Pulse/Pattern/Data Generators

Application Note 2002-04-08