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PDF
599 KB
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8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.
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2000-06-01
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Application Note
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PDF
202 KB
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Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.
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2007-04-04
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Application Note
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PDF
121 KB
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Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Agilent E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.
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2007-04-04
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Application Note
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PDF
386 KB
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Effective Electrolytic Capacitors Testing (AN 1305-4)
With increased requirements for size reduction and higher reliability design, it is becoming necessary to evaluate electrolytic capacitors employed in electronic equipment. Production volume has been increasing for circuit applications. Manufacturing and QA now have to improve their testing of...
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2000-11-01
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Application Note
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PDF
945 KB
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Effective Multitap Transformer Testing Using a Scanner (AN 1224-5)
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Agilent 4263B LCR Meter.
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2001-11-05
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Application Note
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PDF
263 KB
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Effective Transformer/LF Coil Testing (AN 1305-3)
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...
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2008-11-20
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Application Note
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PDF
471 KB
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High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Agilent 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.
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2001-10-25
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Application Note
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PDF
2.02 MB
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Impedance Measurement Handbook
Impedance measurements basics using Agilent Technologies' LCR meters and impedance analysers.
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2009-06-17
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Application Note
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PDF
168 KB
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Improve Electronic Product Quality and Performance with Agilent Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Agilent's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.
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2006-06-26
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Application Note
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PDF
206 KB
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Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Agilent E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.
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2007-04-12
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Application Note
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PDF
243 KB
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Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Agilent E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.
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2007-04-13
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Application Note
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MEMS/NEMS Device Measurement Solution
Agilent helps you characterize MEMS/NEMS device.
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2008-06-04
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Application Note
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PDF
283 KB
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Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Agilent 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
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2008-12-10
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Application Note
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PDF
321 KB
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Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.
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2008-11-21
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Application Note
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