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L4411A System Digital Multimeter, 6½ Digit High Performance - Quick Fact Sheet
This two page QFS/Quick Fact Sheet includes key features and product specifications for the Agilent L4411A System Digital Multimeter, 6 1/2 Digit high performance.

Promotional Materials 2012-12-01

PDF PDF 112 KB
L4411A/34410A/11A Digital Multimeter User's Guide
34410-90001; Edition 5. Quick start chapter, features and functions, remote interface configuration, measurement tutorial and product specifications.

User Manual 2012-06-01

PDF PDF 2.53 MB
Languages 
Test-System Development Guide: A Comprehensive Handbook for Test Engineers
Test-System Development Guide

Application Note 2012-05-07

PDF PDF 5.04 MB
Languages 
Resistance, DC Current, AC Current, and Frequency and Period Measurement Errors in Digital...
This application note is the second in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers resistance, dc current, ac current, and frequency and period measurement errors. For an overview of system...

Application Note 2012-05-07

PDF PDF 323 KB
Languages 
34410A/11A 6 ½ Digit Multimeter Programmer’s Reference
This help file contains reference information to help you program the 34410/11A over a remote interface using SCPI programming language.

Help File 2012-03-01

ZIP ZIP 961 KB
Practical Temperature Measurements (AN-290)
The purpose of this application note is to explore the more common temperature measurement techniques, and introduce procedures for improving their accuracy.

Application Note 2012-01-26

PDF PDF 1.29 MB
Agilent L4411A 1U 6 1/2 Digit Multimeter Data Sheet
The Agilent L4411A 1U high performance digital multimeter offers fast, accurate and affordable system testing.

Data Sheet 2011-11-16

PDF PDF 545 KB
Languages 
LXI Brochure
The Agilent LXI Brochure shows you how to open the door to simpler system creation.

Brochure 2011-06-16

Declaration of Conformity
Search Agilent Regulatory database for most recent Declaration of Conformity statement for your product.

Help File 2010-10-15

Improving DMM throughput
Whether your electronic test is in a manufacturing, design validation, or R&D environment, reducing your test time translates to lower cost and shortened product development schedules, both of which are clear benefits.

Application Note 2010-06-24

PDF PDF 595 KB
Data Logging and Digitizing Using a Digital Multimeter
This measurement tip describes the use of a digital multimeter for data logging and digitizing.

Data Sheet 2010-06-24

PDF PDF 604 KB
Languages 
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Agilent products and solutions.

Application Note 2009-12-07

PDF PDF 1.04 MB
Languages 
Using MATLAB in conjuction with an AWG to create complex repetitive waveforms
A variety of electronic test applicatioEngineers often need to generate complex test signals that go far beyond a simple sine, square or triangle waveform. They typically use an arbitrary waveform generator or “arb” to generate these signals..

Application Note 2009-03-09

PDF PDF 623 KB
Adding DC Offsets to a Function Generator's Output
A variety of electronic test applications require a DC offset to be added to the output of a function generator.

Application Note 2009-03-09

PDF PDF 383 KB
Make better AC measurements with your DMM
When you use a digital multimeter to measure AC voltages, it is important to know how your DMM makes the measurements and understand your instrument's limitations.

Application Note 2008-12-19

PDF PDF 605 KB
Using Pulse-Width Modulation to Control Signals
The use of pulse-width modulation (PWM) has become an increasingly popular technique for controlling analog circuits with a digital signal.

Application Note 2008-10-30

PDF PDF 296 KB
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Waveform capture, modification and playback using a function generator
Function generators are used to simulate real-world signals on a device.

Application Note 2008-10-30

PDF PDF 280 KB
Languages 
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

PDF PDF 281 KB
Languages 
The Next Generation of Test: An LXI Overview

Promotional Materials 2007-11-13

PDF PDF 1.89 MB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Application Note 2007-07-08

PDF PDF 200 KB
Languages 
Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of an Agilent LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
L4411A Digital Multimeter Getting Started Guide

Quick Start Guide 2007-03-01

PDF PDF 1.05 MB
L4411A Press Release
L4411A Press Release

Press Materials 2007-03-01

Agilent L4411A Makes It Easy for ATTI to Transition Test System from VXI to LXI
Advanced Testing Technologies, Inc. (ATTI) served as a beta test site for the new L4411A 6 ½ digit 1U DMM and found it easy and fast to replace their E1412A VXI DMM with the L4411A LXI DMM in their test system. This paper describes their experience.

Application Note 2007-02-28

PDF PDF 178 KB

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