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CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

어플리케이션 노트 2013-10-10

PDF PDF 2.61 MB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn how to perform CAN symbolic-level triggering and decoding using an Agilent 9000 Series oscilloscope.

어플리케이션 노트 2013-09-24

PDF PDF 1.79 MB
Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Application note
PC-based oscilloscope analysis software enables engineers to work remote from the target system and scope, and it makes sharing and analyzing data an easier experience.

어플리케이션 노트 2013-09-05

PDF PDF 803 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn how to perform CAN symbolic-level triggering and decode with these step-by-step instructions.

어플리케이션 노트 2013-07-29

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Agilent's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

어플리케이션 노트 2013-07-24

PDF PDF 3.03 MB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

어플리케이션 노트 2013-05-10

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note
For signals with long idle times between low duty cycle pulses or bursts of signal activity, a scope with segmented memory can extend the amount of time and number of serial packets captured

어플리케이션 노트 2013-03-27

PDF PDF 2.63 MB
Oscilloscope Selection Tip 9: Measurements & Analysis - Application Note
One of the major advantages of today's digital storage oscilloscopes (DSOs) over older analog scope technology is that they have the ability to perform various automatic measurements and analysis on digitized waveforms.

어플리케이션 노트 2013-03-27

PDF PDF 1.67 MB
Evaluating Oscilloscope Fundamentals - Application Note
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

어플리케이션 노트 2013-03-06

Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note
To overcome pattern length limitations found in many of today’s jitter analysis tools, Agilent developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

어플리케이션 노트 2013-02-21

PDF PDF 3.47 MB
Characterizing Hi-speed USB 2.0 Serial Buses in Embedded Designs - Application Note
The USB 2.0 serial interface has been rapidly replacing older RS-232 serial interfaces in embedded designs.

어플리케이션 노트 2013-01-24

FlexRay Physical Layer Eye-diagram Mask Testing - Application Note
Agilent provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

어플리케이션 노트 2012-11-09

Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses
Agilent's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

어플리케이션 노트 2012-11-08

Oscilloscopes in Aerospace/Defense Debugging ARINC 429 serial buses
Agilent’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.

어플리케이션 노트 2012-11-08

Oscilloscope Mask Testing for Six Sigma Quality Standards - Application Note
This application note discusses the statistical principles that apply to the QA process and the evolution of Six Sigma efficiency-defined as achieving a defect rate of 3.4 per million or less.

어플리케이션 노트 2012-11-07

MIL-STD 1553 Eye-diagram Mask Testing - Application Note
Eye-diagram mask testing can be performed on differential MIL-STD 1553 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

어플리케이션 노트 2012-10-31

PDF PDF 2.44 MB
ARINC 429 Eye-diagram and Pulse-shape Mask Testing - Application Note
Eye-diagram and pulse-shape pass/fail mask testing can be performed on differential ARINC 429 signals using an Agilent 3000 X-Series oscilloscope licensed with the DSOX3AERO and DSOX3MASK options.

어플리케이션 노트 2012-10-31

PDF PDF 2.69 MB
Switch Mode Power Supply Measurements
This app note gives instructions on how to perform a broad range of power analysis measurements on your SMPS and how to perform these measurements when using Measurements Training Kit as the DUT.

어플리케이션 노트 2012-10-26

Accelerate Program Development using Agilent Command Expert with Agilent VEE - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with Agilent VEE Pro.

어플리케이션 노트 2012-08-16

PDF PDF 1.41 MB
State of the Art in Sub-10ps Pulse Generators: Technology, Performance, and Applications
This article will present an overview of sub-10 ps pulse generator architectures, important performance considerations, and conclude with a discussion of key applications.

어플리케이션 노트 2012-07-23

PDF PDF 378 KB
When it is time to transition to a higher bandwidth oscilloscope?
How do we determine how much bandwidth is required for today's projects, and when do we know when it is time to "move up"?

어플리케이션 노트 2012-07-15

PDF PDF 469 KB
Accelerate Program Development using Agilent Command Expert with Labview
This application note describes how to accelerate program development using Command Expert with LavbVIEW.

어플리케이션 노트 2012-06-29

PDF PDF 1.32 MB
Accelerate Program Development using Agilent Command Expert with MATLAB - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with MATLAB.

어플리케이션 노트 2012-06-05

PDF PDF 3.44 MB
Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

어플리케이션 노트 2012-05-02

PDF PDF 6.46 MB
Accelerate Program Development with Agilent Command Expert with Microsoft® Visual Studio®
This application note describes how Agilent Command Expert with Microsoft Visual Studio can accelerate program development

어플리케이션 노트 2012-04-17

PDF PDF 1.76 MB

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