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Accurate Absolute and Relative Power Measurements Using the N5531S - Application Note

Application Note 2012-12-04

PDF PDF 7.76 MB
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Making EMI Compliance Measurements
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2011-03-09

PDF PDF 1.53 MB
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Making Conducted and Radiated Emissions Measurements
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

PDF PDF 1.90 MB
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8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1)
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

PDF PDF 739 KB
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Migrating Code from the 8903B to the U8903A
This application note describes how to migrate the old commands used for HP 8903B to SCPI commands used by U8903A.

Application Note 2009-06-29

PDF PDF 267 KB
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Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

PDF PDF 2.91 MB
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Characterizing Clock Jitter through Phase Noise Measurements Speeds up Design Verification Process
This white paper discusses a new measurement method for obtaining highly accurate low random jitter (RJ) measurements and performing real-time analysis of RJ and periodic jitter (PJ) of components.

Application Note 2008-11-20

PDF PDF 688 KB
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Characterizing phase-locked-loop signal transition behaviors of Microphonic/Phase-hit
This paper discusses how Agilent's Signal Source Analyzer helps you to identify unwanted phase-locked-loop transition "phase-hits", and achieve easy, comprehensive and accurate phase-locked-loop characterization in both linear and nonlinear regions.

Application Note 2008-10-02

PDF PDF 1.68 MB
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A Design of Experiments for Gigabit Serial Backplane Channels

Application Note 2008-09-03

PDF PDF 2.44 MB
Data Mining 12-Port S-Parameters

Application Note 2008-08-11

PDF PDF 830 KB
New Test Methodologies Improve EMI Testing Efficiency
This 7 page application note discusses a sampling of PSA features of interest to the EMI community that will increase both the quality of data and speed by which results can be derived.

Application Note 2008-05-28

PDF PDF 801 KB
Fast, Easy, and Accurate Microwave Phase Noise Measurements using the E5052B with the E5053A

Application Note 2008-05-22

PDF PDF 1.07 MB
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E5052B Signal Source Analyzer Advanced Phase Noise and Transient Measurement Techniques
This application notes describes two major advanced techniques of the SSA in phase noise measurement and transient measurement.

Application Note 2007-10-02

PDF PDF 1.28 MB
Making Compliance Measurements with the N9039A-Based EMI Measurement Receiver

Application Note 2007-08-15

PDF PDF 1.58 MB
Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Backplane Differential Channel Microprobe Characterization in time and Frequency Domains

Application Note 2007-05-09

PDF PDF 769 KB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, & 2-Port TDR
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2007-01-01

PDF PDF 3.50 MB
Using Clock Jitter Analysis to Reduce BER in Serial Data Applications
This Application Note emphasizes on the emerging techniques for reference clock jitter analysis from the perspective of oscillator physics, phase noise theory, and serial data technology.

Application Note 2006-12-01

PDF PDF 1.15 MB
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Spectrum Analyzer Basics (AN 150)
Fundamentals of spectrum analyzer measurements

Application Note 2006-08-02

PDF PDF 3.71 MB
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Stripline TRL Calibration Fixtures for 10-Gigabit Interconnect Analysis

Application Note 2006-04-05

PDF PDF 1.11 MB
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Designing High Speed Backplanes Utilizing Physical Layer Test System
This Application Note focuses on the problems introduced into the backplane assembly design by the many linear passive components that create reflections due to impedance discontinuities.

Application Note 2006-01-18

PDF PDF 1.24 MB
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Limitations and Accuracies of Time and Frequency Domain Analysis of Physical Layer Devices

Application Note 2005-11-01

PDF PDF 2.83 MB
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Validating Transceiver FPGAs Using Advanced Calibration Techniques

Application Note 2005-04-27

PDF PDF 1.37 MB
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Investigating Microvia Technology for 10 Gbps Higher Telecommunications Systems

Application Note 2005-04-05

PDF PDF 1.37 MB

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