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Generating and Applying High-Power Output Signals
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.

Notes d’application 2009-09-30

PDF PDF 333 KB
Langues 
Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.

Notes d’application 2009-09-03

PDF PDF 1.11 MB
Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Notes d’application 2008-10-15

PDF PDF 281 KB
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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.

Notes d’application 2007-09-19

PDF PDF 646 KB
Langues 
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Notes d’application 2007-02-02

PDF PDF 175 KB
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Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Notes d’application 2006-08-28

PDF PDF 290 KB
Langues 
Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Notes d’application 2005-04-01

Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Notes d’application 2005-03-29

PDF PDF 263 KB
Choosing Your Test System Software Architecture (AN 1465-4)

Notes d’application 2004-12-21

PDF PDF 409 KB
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Notes d’application 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Notes d’application 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Notes d’application 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Notes d’application 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Notes d’application 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Notes d’application 2004-09-14

PDF PDF 182 KB
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Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Notes d’application 2004-07-29

PDF PDF 270 KB
66000 Modular Power System Product Note
This 50-page product note provides information on how you can get the most from the advanced programmable features of the Agilent 66000 MPS to address a variety of applications.

Notes d’application 2003-04-28

PDF PDF 280 KB