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1-25 of 33
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6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems
Application Note 2012-04-30 |
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Generating and Applying High-Power Output Signals
This application note describes both the inner workings of the PSG with Option 521 and the applications of its high-power output signals.
Application Note 2009-09-30 |
PDF
333 KB
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Using MATLAB to Create Agilent Signal and Spectrum Analyzer Applications
Learn to use MATLAB software to configure, control, and acquire data from X-Series signal and spectrum analyzers, and then use scripts to create, modify and execute custom analyzer applications.
Application Note 2009-09-03 |
PDF
1.11 MB
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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance
Application Note 2008-10-15 |
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Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.
Application Note 2008-03-10 |
PDF
894 KB
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Improving Throughput with Fast RF Signal Generator Switching
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.
Application Note 2007-09-19 |
PDF
646 KB
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Modifying a GPIB System to Include LAN/LXI (AN 1465-26)
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.
Application Note 2007-05-10 |
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Using Linux in Your Test Systems: Linux Basics (AN 1465-27)
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.
Application Note 2007-05-08 |
PDF
303 KB
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LXI-compliant oscilloscope boosts efficiency in ATE systems
The LXI (LAN eXtensions for Instrumentation) standard specifies the interaction of proven,
widely used standards to enable fast, efficient, and cost-effective creation and reconfiguration of
test systems.
Application Note 2007-04-02 |
PDF
286 KB
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Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.
Application Note 2007-02-02 |
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Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.
Application Note 2006-08-28 |
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How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)
Application Note 2006-06-06 |
PDF
275 KB
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Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16)
Application Note 2006-05-01 |
PDF
263 KB
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Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20)
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.
Application Note 2006-01-17 |
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Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)
Application Note 2005-10-31 |
PDF
126 KB
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Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs
Topics include balancing cost,
convenience and security in three
common LAN scenarios: sharing
instruments, remote monitoring and
data acquisition, and functional test
systems. Includes downloadable example programs.
Application Note 2005-04-01 |
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Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note
This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.
Application Note 2005-03-29 |
PDF
263 KB
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Introduction to Test-System Design (AN 1465-1)
Application Note 2005-01-20 |
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Understanding the Effects of Racking & System Interconnections (AN 1465-6)
Application Note 2004-12-21 |
PDF
235 KB
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Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5)
Application Note 2004-12-21 |
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Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note
This application note answers common questions
about the use of drivers and direct I/O to send commands from a PC application to the test instrument.
Application Note 2004-12-21 |
PDF
374 KB
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Choosing Your Test System Software Architecture (AN 1465-4)
Application Note 2004-12-21 |
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Test-System Development Guide: Operational Maintenance (AN 1465-8)
Application Note 2004-12-21 |
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Maximizing System Throughput and Optimizing System Deployment (AN 1465-7)
Application Note 2004-12-21 |
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Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note
Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems
Application Note 2004-12-13 |
PDF
408 KB
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