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81100 Family of Pulse/Pattern Generators the Dual Clock Gbit Chip Test (PN 2) In this Product Note the principle is to deliver a variable clock to feed either your device(s), board(s) or instrument(s). Due to the two channel capability it is also possible to generate clocks which ... 어플리케이션 노트 2004-10-18	PDF 220 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane. 어플리케이션 노트 2004-10-12	PDF
8753/8720 Pulsed Measurements The aim of this Product Note is to show that under certain conditions, network analyzers such as the Agilent 8720ES and 8753ES can produce good results at a much lower cost. 어플리케이션 노트 2000-05-01	PDF 392 KB