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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the Agilent solution for the USB 2.0 test suite. The Agilent solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.
Application Note 2013-05-10 |
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2.02 MB
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DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.
Application Note 2013-01-24 |
PDF
1.65 MB
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Frequency Domain Analysis of Jitter Amplification in Clock Channels
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.
Application Note 2012-11-01 |
PDF
257 KB
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Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.
Application Note 2012-09-21 |
PDF
467 KB
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S-parameter Series: Practical Application of the InfiniiSim Waveform Transformation Toolset Applicat
Presents and addresses five of the most common problems that confront engineers when trying to measure performance on high speed links, using an oscilloscope.
Application Note 2012-08-21 |
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Crossing the Digital-Analog Divide - White Paper
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.
Application Note 2012-05-02 |
PDF
6.46 MB
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Which Electromagnetic Simulator Should I Use?
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.
Application Note 2012-04-06 |
PDF
3.21 MB
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Simulating FPGA Power Integrity Using S-Parameter Models
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).
Application Note 2012-04-02 |
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5.68 MB
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S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note
Discusses using de-embedding tools to gain virtual access to difficult measurement points
Application Note 2012-03-11 |
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Transforming Oscilloscope Acquisitions for De-Embedding, Embedding and Simulating Channel Effects
Covers fundamentals of understanding the design parameters, the various methods of data acquisition and implementing the results into a first-class design
Application Note 2012-03-05 |
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S-parameter Series: S-parameter Requirements for Oscilloscope De-Embedding Applications
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters
Application Note 2012-03-02 |
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S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding
Application Note 2012-03-01 |
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6 Hints for Better SATA and SAS Measurements
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.
Application Note 2012-02-02 |
PDF
1.59 MB
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Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note
Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Agilent's line of performance network analyzers (PNAs) focused on Software.
Application Note 2012-01-19 |
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Effective Reflection Characterization for Active Devices Using ENA Option TDR Application Note
This application note describes Hot TDR measurement, which is an effective characterization method for the reflection of transmitter and receiver.
Application Note 2012-01-12 |
PDF
416 KB
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Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.
Application Note 2011-11-15 |
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PCI Express Transmitter Electrical Validation and Compliance Testing - Application Note
This application note is intended for digital designers and developers validating electrical
performance of PCI Express-based designs and working toward electrical compliance of PCI Express products.
Application Note 2011-10-28 |
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1.01 MB
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Probing High-Speed Signals with the 86100 Series of Wide-Bandwidth Sampling Oscilloscopes (86100-6)
Product Note 86100-6 discusses three important measurement accessories that help make probe-based measurements both simple and accurate for the Agilent 86100 Wide-Bandwidth Oscilloscope.
Application Note 2011-07-28 |
PDF
651 KB
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Measurement Uncertainty of VNA based TDR/TDT Measurement Application Note
This application note explains the theory of measurement uncertainty in TDR/TDT measurement with the ENA Option TDR.
Application Note 2011-07-08 |
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1.77 MB
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A Simple, Powerful Method to Characterize Differential Interconnects
The Automatic Fixture Removal (AFR) process is a new technique to extract accurate, high bandwidth models of interconnects that is both simple and accurate.
Application Note 2011-06-17 |
PDF
3.48 MB
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Understanding the Kramers-Kronig Relation Using A Pictorial Proof
The Kramers-Kronig relation lets us build a causal time-domain model from bandlimited s-parameters. This pictorial proof aids understanding of the physics of causality and hence the validity of this approach.
Application Note 2010-03-31 |
PDF
238 KB
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Using ADS for Signal Integrity Optimization
This white paper shows how to replace a multi-dimensional sweep of a long running PRBS time-domain simulation (including manual data evaluation) by short, channel-pulse characterization in the Advanced Design System to efficiently optimize a channel.
Application Note 2009-10-19 |
PDF
275 KB
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Preselector Tuning for Amplitude Accuracy in Microwave Spectrum Analysis
This 8 page application note introduces the technique for broadband modulated signals employed in the new MXA signal analyzer.
Application Note 2009-08-14 |
PDF
387 KB
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Mixed Analog & Digital Signal Debug and Analysis Using a Mixed-Signal Oscilloscope
Using a mixed analog and digital 32 bit WLAN application example, this note shows how an MSO with deep memory makes debugging today’s mixed analog and digital designs easier than ever before.
Application Note 2009-06-01 |
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Power Toolbox for Embedded System Designs
Properly Powering On and Off Multiple Power Inputs in Embedded Designs
Application Note 2009-06-01 |
PDF
163 KB
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